Comparison of pixelated CdZnTe, CdTe and Si Sensors with the simultaneously counting and integrating CIX chip

IEEE Transactions on Nuclear Science

Volumn 56, Issue 6, 2009, Pages 3819-3827

  Fink, Johannes ^a   Kraft, Edgar ^a   Krüger, Hans ^a   Wermes, Norbert ^a   Engel, Klaus Jürgen ^b   Herrmann, Christoph ^b  

^a UNIVERSITY OF BONN   (Germany)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

CdTe CdZnTe detectors; CIX; Pixel cross talk; Polarization

Indexed keywords

CDTE; CHARGE SHARING; CIX; DETECTOR RESPONSE; DIRECT CONVERTING; DYNAMIC RANGE; HYBRID PIXEL DETECTORS; INTEGRATING SYSTEMS; KEY FEATURE; MEDICAL X-RAY IMAGING; PHOTON ENERGY; PIXEL CROSS-TALK; SENSOR MATERIALS; SIMULATIONS AND MEASUREMENTS; TEMPORAL STABILITY; TIME-SCALES; X RAY FLUORESCENCE;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; CROSSTALK; MEDICAL IMAGING; PHOTONS; PIXELS; POLARIZATION;

SENSORS;

EID: 72349092641     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2033111     Document Type: Conference Paper

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