Single photon counting X-ray imaging with Si and CdTe single chip pixel detectors and multichip pixel modules

IEEE Transactions on Nuclear Science

Volumn 51, Issue 4 I, 2004, Pages 1717-1723

  Löcker, Mario ^a   Fischer, Peter ^a,b   Krimmel, Sven ^a,c   Krüger, Hans ^a   Lindner, Markus ^a,d   Nakazawa, Kazuhiro ^e   Takahashi, Tadayuki ^e,f   Wermes, Norbert ^a  

^a UNIVERSITY OF BONN   (Germany)

^b UNIVERSITY OF MANNHEIM   (Germany)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^d ROBERT BOSCH GMBH   (Germany)

^e JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^f UNIVERSITY OF TOKYO   (Japan)

Author keywords

CdTe; Multichip module; Photon counting; Pixel detector; Si; X ray imaging

Indexed keywords

CDTE; MULTICHIP MODULE (MCM); PHOTON COUNTING; PIXEL DETECTORS; X-RAY IMAGING;

BONDING; CADMIUM COMPOUNDS; ELECTRODES; MEDICAL IMAGING; PHOTODETECTORS; PHOTONS; SENSORS; SHIELDING; SILICON; X RAYS;

IMAGING TECHNIQUES;

EID: 3342974445     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.832610     Document Type: Conference Paper

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