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Volumn 54, Issue 5, 2007, Pages 1723-1727

Dynamic lateral polarization in CdZnTe under high flux X-ray irradiation

Author keywords

CdZnTe; Polarization; Semiconductor radiation detectors; X ray detectors; X ray imaging

Indexed keywords

CATHODES; IMAGING SYSTEMS; LIGHT POLARIZATION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; TERNARY ALLOYS;

EID: 35348960024     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.905159     Document Type: Article
Times cited : (34)

References (7)
  • 3
    • 34548079994 scopus 로고    scopus 로고
    • Ultra high flux 2D CdZnTe monolithic detector arrays for x-ray imaging applications
    • Aug
    • Cs. Szeles, S. A. Soldner, S. Vydrin, J. Graves, and D. S. Bale, "Ultra high flux 2D CdZnTe monolithic detector arrays for x-ray imaging applications," IEEE Trans. Nucl. Sci., vol. 54, no. 4, pp. 1350-1358, Aug. 2007.
    • (2007) IEEE Trans. Nucl. Sci , vol.54 , Issue.4 , pp. 1350-1358
    • Szeles, C.1    Soldner, S.A.2    Vydrin, S.3    Graves, J.4    Bale, D.S.5
  • 6
    • 3042835524 scopus 로고    scopus 로고
    • Development of the high-pressure electro-dynamic gradient crystal growth technology for semi-insulating CdZnTe growth for radiation detector applications
    • Cs. Szeles, S. E. Cameron, S. A. Soldner, J.-O. Ndap, and M. D. Reed, "Development of the high-pressure electro-dynamic gradient crystal growth technology for semi-insulating CdZnTe growth for radiation detector applications," J. Electron. Mater., vol. 33, pp. 742-751, 2004.
    • (2004) J. Electron. Mater , vol.33 , pp. 742-751
    • Szeles, C.1    Cameron, S.E.2    Soldner, S.A.3    Ndap, J.-O.4    Reed, M.D.5
  • 7
    • 35349024487 scopus 로고    scopus 로고
    • The nature of polarization in wide band-gap semiconductor detectors under high-flux irradiation: Application to CdZnTe
    • San Diego, CA, Oct./Nov
    • D. S. Bale and Cs. Szeles, "The nature of polarization in wide band-gap semiconductor detectors under high-flux irradiation: Application to CdZnTe," in Proc. 16th Int. Workshop Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors, San Diego, CA, Oct./Nov. 2006, pp. R2-R5.
    • (2006) Proc. 16th Int. Workshop Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors
    • Bale, D.S.1    Szeles, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.