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Volumn 560, Issue 2, 2006, Pages 435-443

Characterization of charge collection in CdTe and CZT using the transient current technique

Author keywords

CdTe; Charge collection; Current; CZT; Electric field; Mobility

Indexed keywords

CADMIUM COMPOUNDS; COMPOSITION; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; PARTICULATE EMISSIONS; POLARIZATION; PULSE SHAPING CIRCUITS; SENSORS; SIGNAL DETECTION; SILICON; TRANSIENTS;

EID: 33646088601     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.01.072     Document Type: Article
Times cited : (59)

References (22)
  • 1
    • 33646113738 scopus 로고    scopus 로고
    • Material Properties-Semiconductor Detector Materials, eV Products, Saxonburg Blvd., Saxonburg, USA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.