메뉴 건너뛰기




Volumn 94, Issue 2, 2010, Pages 381-385

Thin-film monocrystalline-silicon solar cells made by a seed layer approach on glass-ceramic substrates

Author keywords

Anodic bonding; Crystalline silicon; Epitaxy; Implant induced separation; Seed layer; Thin film solar cell

Indexed keywords

ANODIC BONDING; CRYSTALLINE SILICONS; INDUCED SEPARATION; SEED LAYER; THIN-FILM SOLAR CELLS;

EID: 72149117669     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.08.015     Document Type: Article
Times cited : (42)

References (17)
  • 3
    • 0001039356 scopus 로고    scopus 로고
    • Elucidation of the layer exchange mechanism in the formation of polycrystalline silicon by aluminum-induced crystallization
    • Nast O., and Wenham S. Elucidation of the layer exchange mechanism in the formation of polycrystalline silicon by aluminum-induced crystallization. Journal of Applied Physics 88 (2000) 124-132
    • (2000) Journal of Applied Physics , vol.88 , pp. 124-132
    • Nast, O.1    Wenham, S.2
  • 8
    • 44649141362 scopus 로고    scopus 로고
    • Intragrain defects in polycrystalline silicon thin-film solar cells on glass by aluminum-induced crystallization and subsequent epitaxy
    • Liu F., Romero M., Jones K., Norman A., Al-Jassim M., Inns D., and Aberle A. Intragrain defects in polycrystalline silicon thin-film solar cells on glass by aluminum-induced crystallization and subsequent epitaxy. Thin Solid Films 516 (2008) 6409-6412
    • (2008) Thin Solid Films , vol.516 , pp. 6409-6412
    • Liu, F.1    Romero, M.2    Jones, K.3    Norman, A.4    Al-Jassim, M.5    Inns, D.6    Aberle, A.7
  • 9
    • 67649497842 scopus 로고    scopus 로고
    • Intragrain defects in polycrystalline silicon layers grown by aluminum-induced crystallization and epitaxy for thin-film solar cells
    • Van Gestel D., Gordon I., Bender H., Saurel D., Vanacken J., Beaucarne G., and Poortmans J. Intragrain defects in polycrystalline silicon layers grown by aluminum-induced crystallization and epitaxy for thin-film solar cells. Journal of Applied Physics 105 (2009) 114507-1-114507-11
    • (2009) Journal of Applied Physics , vol.105
    • Van Gestel, D.1    Gordon, I.2    Bender, H.3    Saurel, D.4    Vanacken, J.5    Beaucarne, G.6    Poortmans, J.7
  • 11
    • 0032644535 scopus 로고    scopus 로고
    • Transparent, high strain point spinel glass-ceramics
    • Pinckney L.R. Transparent, high strain point spinel glass-ceramics. Journal of Non-Crystalline Solids 255 (1999) 171-177
    • (1999) Journal of Non-Crystalline Solids , vol.255 , pp. 171-177
    • Pinckney, L.R.1
  • 12
    • 45749124925 scopus 로고    scopus 로고
    • Glass-Based SOI Structures,
    • US Patent 7, 176, 528
    • J.G. Couillard, K.P. Gadkaree, J.F. Mach, Glass-Based SOI Structures, US Patent 7, 176, 528 (2007).
    • (2007)
    • Couillard, J.G.1    Gadkaree, K.P.2    Mach, J.F.3
  • 14
    • 0018439616 scopus 로고
    • Defect etch for 〈1 0 0〉 silicon evaluation
    • Schimmel D. Defect etch for 〈1 0 0〉 silicon evaluation. Journal of Electrochemical Society 126 (1979) 479-483
    • (1979) Journal of Electrochemical Society , vol.126 , pp. 479-483
    • Schimmel, D.1
  • 15
    • 22944440029 scopus 로고    scopus 로고
    • Defect passivation in chemical vapour deposited fine-grained polycrystalline silicon by plasma hydrogenation
    • Carnel L., Gordon I., Van Nieuwenhuysen K., Van Gestel D., Beaucarne G., and Poortmans J. Defect passivation in chemical vapour deposited fine-grained polycrystalline silicon by plasma hydrogenation. Thin Solid Films 487 (2005) 147-151
    • (2005) Thin Solid Films , vol.487 , pp. 147-151
    • Carnel, L.1    Gordon, I.2    Van Nieuwenhuysen, K.3    Van Gestel, D.4    Beaucarne, G.5    Poortmans, J.6
  • 16
  • 17
    • 0037566677 scopus 로고    scopus 로고
    • Method to extract diffusion length from solar cell parameters-application to polycrystalline silicon
    • Taretto K., Rau U., and Werner J.H. Method to extract diffusion length from solar cell parameters-application to polycrystalline silicon. Journal of Applied Physics 93 (2003) 5447-5455
    • (2003) Journal of Applied Physics , vol.93 , pp. 5447-5455
    • Taretto, K.1    Rau, U.2    Werner, J.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.