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Volumn 130, Issue 3, 2010, Pages 411-414
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Highly efficient photoluminescence of Er2SiO5 films grown by reactive magnetron sputtering method
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Author keywords
Erbium silicate; Photoluminescence; Si photonics
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Indexed keywords
ANNEALING TREATMENTS;
AS-DEPOSITED FILMS;
CONCENTRATION OF;
CRYSTALLINE STRUCTURE;
EMISSION INTENSITY;
PHOTON FLUX;
PL INTENSITY;
POWER DEPENDENCE;
REACTIVE MAGNETRON SPUTTERING METHOD;
RUTHERFORD BACK-SCATTERING;
SCANNING ELECTRON MICROSCOPE;
SI PHOTONICS;
SI SUBSTRATES;
SI-BASED;
TEMPERATURE-DEPENDENT PHOTOLUMINESCENCE;
THERMAL QUENCHING;
THERMAL TREATMENT;
UP-CONVERSION;
X-RAY DIFFRACTION MEASUREMENTS;
LIGHT;
LIGHT SOURCES;
MAGNETRONS;
PHOTOLUMINESCENCE;
QUENCHING;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
SILICATES;
SILICON;
ERBIUM;
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EID: 72149103535
PISSN: 00222313
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jlumin.2009.10.005 Document Type: Article |
Times cited : (19)
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References (15)
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