SCOPUS 정보 검색 플랫폼

Volumn 99, Issue 3, 2008, Pages 322-328

Study of thin film structure based on MgF2, CeO2 and Al2O3 layers for optical applications

Author keywords

Antireflection coatings; Multilayers; Thin films

Indexed keywords

ANNEALING; ANTIREFLECTION COATINGS; DEPOSITION; EVAPORATION; GLASS; HEATING; MAGNESIUM COMPOUNDS; PARTICLE SIZE; X RAY DIFFRACTION;

INDIVIDUAL LAYERS; RESISTIVE HEATING EVAPORATION; SPECTRAL RANGE;

MULTILAYER FILMS;

EID: 41749093823 PISSN: 18625282 EISSN: None Source Type: Journal
DOI: 10.3139/146.101629 Document Type: Article

Times cited : (5)

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