Using electrons as a high-Resolution probe of optical modes in individual nanowires

Nano Letters

Volumn 9, Issue 12, 2009, Pages 4073-4077

  Arslan, Ilke ^a,e   Hyun, Jerome K ^b   Erni, Rolf ^c   Fairchild, Michael N ^d   Hersee, Stephen D ^d   Muller, David A ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b Department of Obstetrics Gynecology   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF NEW MEXICO   (United States)

^e University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX NANOSTRUCTURES; DIELECTRIC OPTICAL WAVEGUIDES; GAN NANOWIRES; HIGH-RESOLUTION PROBE; OPTICAL MODES; OPTOELECTRONIC APPLICATIONS; SPATIALLY RESOLVED; SUB-WAVELENGTH; TRANSITION RADIATION;

ELECTRIC WIRE; ELECTRON BEAMS; GALLIUM NITRIDE; NANOWIRES; OPTOELECTRONIC DEVICES; SEMICONDUCTING GALLIUM;

INTEGRATED OPTOELECTRONICS;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELECTRON; LIGHT; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; RADIATION EXPOSURE; ULTRASTRUCTURE;

COMPUTER SIMULATION; ELECTRONS; LIGHT; MODELS, CHEMICAL; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE;

EID: 71949127115     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl902266n     Document Type: Article

References (29)

1. Johnson, J. C.; Choi, H. J.; Knutsen, K. P.; Schaller, R. D.; Yang, P. D.; Saykally, R. J. Nat. Mater. 2002, 1 (2), 106-110.
2. Fan, Z. Y.; Ho, J. C.; Jacobson, Z. A.; Razavi, H.; Javey, A. Proc. Natl. Acad Sci. U.S.A. 2008, 105 (32), 11066-11070.
3. Wang, J. F.; Gudiksen, M. S.; Duan, X. F.; Cui, Y.; Lieber, C. M. Science 2001, 293 (5534), 1455-1457.
4. Kelzenberg, M. D.; Turner-Evans, D. B.; Kayes, B. M.; Filler, M. A.; Putnam, M. C.; Lewis, N. S.; Atwater, H. A. Nano Lett. 2008, 8 (2), 710-714.
5. Tian, B. Z.; Zheng, X. L.; Kempa, T. J.; Fang, Y.; Yu, N. F.; Yu, G. H.; Huang, J. L.; Lieber, C. M. Nature 2007, 449 (7164), 885-U8.
6. Chen, C. H.; Silcox, J. Phys. Rev. Lett. 1975, 35 (6), 390-393.
7. Schaffer, B.; Hohenester, U.; Trugler, A.; Hofer, F. Phys. Rev. B 2009, 79 (4), 4.
8. Vincent, R.; Silcox, J. Phys. Rev. Lett. 1973, 31 (25), 1487-1490.
9. Wang, Z. L. Micron 1996, 27 (3-4), 265-299.
10. Su, D. S.; Zandbergen, H. W.; Tiemeijer, P. C.; Kothleitner, G.; Havecker, M.; Hebert, C.; Knop-Gericke, A.; Freitag, B. H.; Hofer, F.; Schlogl, R. Micron 2003, 34 (3-5), 235-238.
11. de Abajo, F. J. G.; Kociak, M. Phys. Rev. Lett. 2008, 100 (10), 106804.
12. Yurtsever, A.; Couillard, M.; Muller, D. A. Phys. Rev. Lett. 2008, 100, 217402.
13. Nelayah, J.; Kociak, M.; Stephan, O.; de Abajo, F. J. G.; Tence, M.; Henrard, L.; Taverna, D.; Pastoriza-Santos, I.; Liz-Marzan, L. M.; Colliex, C. Nat. Phys. 2007, 3 (5), 348-353.
14. de Abajo, F. J. G. Phys. Rev. B 1999, 59 (4), 3095-3107.
15. Hyun, J. K.; Couillard, M.; Rajendran, P.; Liddell, C. M.; Muller, D. A. Appl. Phys. Lett. 2008, 93 (24), 243106.
16. Morkoc, H.; Strite, S.; Gao, G. B.; Lin, M. E.; Sverdlov, B.; Burns, M. J. Appl. Phys. 1994, 76 (3), 1363-1398.
17. Nakamura, S.; Senoh, M.; Mukai, T. Appl. Phys. Lett. 1993, 62 (19), 2390-2392.
18. Hersee, S. D.; Sun, X. Y.; Wang, X. Nano Lett. 2006, 6 (8), 1808-1811.
19. Bertsch, G. F.; Esbensen, H.; Reed, B. W. Phys. Rev. B 1998, 58 (20), 14031-14035.
20. Reed, B. W.; Chen, J. M.; MacDonald, N. C.; Silcox, J.; Bertsch, G. F. Phys. Rev. B 1999, 60 (8), 5641-5652.
21. Zabala, N.; Ogando, E.; Rivacoba, A.; de Abajo, F. J. G. Phys. Rev. B 2001, 64, 205410.
22. Bauer, L.; Reiss, E. L. SIAM J. Appl. Math. 1978, 35, 508-514.
23. Djurisic, A. B.; Li, E. H. J. Appl. Phys. 2001, 89 (1), 273-282.
24. Johnson, S. G.; Joannopoulos, J. D. Opt. Express 2001, 8 (3), 173-190.
25. Maslov, A. V.; Ning, C. Z. Appl. Phys. Lett. 2003, 83 (6), 1237-1239.
26. Ginsburg, V.; Frank, I. Zh. Eksp. Teor. Fiz. 1946, 16 (1), 15-28.
27. Jackson, J. D. Classical Electrodynamics, 3rd ed.; Wiley: New York, 1998.
28. Bohr, N. Philos. Mag. 1913, 25, 10.
29. Muller, D. A.; Silcox, J. Ultramicroscopy 1995, 59 (1-4), 195-213.