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Volumn 95, Issue 23, 2009, Pages

High resolution atomic force microscopy imaging of molecular self assembly in liquids using thermal drift corrected cantilevers

(5) Shekhawat, Gajendra S a Chand, Ami c Sharma, Saurabh a Verawati, a,b Dravid, Vinayak P a

a NORTHWESTERN UNIVERSITY (United States)

b NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

c Applied Nanostructures (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM CANTILEVERS; AFM PROBE; AQUEOUS CONDITION; AQUEOUS ENVIRONMENT; ATOMIC FORCE; HIGH RESOLUTION; HIGH RESOLUTION IMAGE; HIGH-RESOLUTION IMAGING; MOLECULAR SELF ASSEMBLY; NONDESTRUCTIVE IMAGING; SILICON CANTILEVER; SILICON PROBE; SINGLE MACROMOLECULES; TAPPING MODES; THERMAL DRIFTS; VERY HIGH RESOLUTION;

NANOCANTILEVERS; PROBES; SELF ASSEMBLED MONOLAYERS; SELF ASSEMBLY;

ATOMIC FORCE MICROSCOPY;

EID: 71949115568 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3266519 Document Type: Article

Times cited : (11)

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