Anomalous scaling in surface roughness evaluation of electrodeposited nanocrystalline Pt thin films

Applied Surface Science

Volumn 256, Issue 3, 2009, Pages 674-682

  Nabiyouni, G ^a   Farahani, B Jalali ^b  

^a ARAK UNIVERSITY   (Iran)

^b Arizona State University   (United States)

Author keywords

Anomalous scaling; Atomic force microscopy (AFM); Electrodeposition; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORROSION; CRYSTALLINE MATERIALS; ELECTRODEPOSITION; ELECTRODES; ELECTROLYTES; FILM GROWTH; FILM THICKNESS; NANOCRYSTALS; PLATINUM; SURFACE ROUGHNESS; X RAY DIFFRACTION;

ANOMALOUS SCALING; CONSTANT CURRENT DENSITY; CRYSTALLINE STRUCTURE; DEPOSITION CURRENT DENSITY; GALVANOSTATIC CONTROL; KINETIC ROUGHENING; NANOCRYSTALLINES; POWER-LAW DEPENDENCES;

THIN FILMS;

EID: 71749115771     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.08.041     Document Type: Article

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