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Volumn 375, Issue 1, 2007, Pages 239-246
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Etched glass surfaces, atomic force microscopy and stochastic analysis
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Author keywords
Etching process; Rough surface; Stochastic process
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DIFFUSION;
ETCHING;
PARAMETER ESTIMATION;
RANDOM PROCESSES;
SURFACE ROUGHNESS;
DRIFT;
ETCHING PROCESS;
ROUGH SURFACES;
ROUGHNESS EXPONENTS;
GLASS;
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EID: 33751502671
PISSN: 03784371
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physa.2006.09.012 Document Type: Article |
Times cited : (27)
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References (24)
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