Controlling surface statistical properties using bias voltage: Atomic force microscopy and stochastic analysis

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 15, 2005, Pages

  Sangpour, P ^a   Jafari, G R ^a   Akhavan, O ^a   Moshfegh, A Z ^a   Tabar, M Reza Rahimi ^a,b  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

^b UNIVERSITÉ CÔTE D'AZUR   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28644449210     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.155423     Document Type: Article

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