Scaling approach to calculate critical exponents in anomalous surface roughening

Physical Review Letters

Volumn 83, Issue 22, 1999, Pages 4594-4597

  López, Juan M ^a,b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038496486     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.4594     Document Type: Article

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