Optical image analysis of the novel ultra-lightweight and high-resolution MEMS X-ray optics

2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009

Volumn , Issue , 2009, Pages 123-124

  Mitsuishi, I ^a   Ezoe, Y ^b   Takagi, U ^b   Hayashi, T ^b   Sato, T ^b   Morishita, K ^c   Nakajima, K ^c   Yamasaki, N Y ^a   Mitsuda, K ^a  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b TOKYO METROPOLITAN UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION; MICRO ELECTRO MECHANICAL SYSTEM; OPTICAL IMAGE ANALYSIS; PARALLEL LIGHT; RADIUS OF CURVATURE; X RAY TELESCOPE;

GEOMETRICAL OPTICS; IMAGE ANALYSIS; LIGHT; MICROELECTROMECHANICAL DEVICES; NANOPHOTONICS; PHOTONICS; SPACECRAFT OBSERVATORIES; TELESCOPES;

MEMS;

EID: 71749112283     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OMEMS.2009.5338574     Document Type: Conference Paper

References (10)

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2. See URL: http://ixo.gsfc.nasa.gov/.
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10. R. Riveros et al, "Magnetic field assisted finishing of ultralightweight and high-resolution MEMS X-ray micro- pore optics," Proceedings of SPIE, 7360, 736040 (2009).