The role of surface roughness in total internal reflection ellipsometry of hybrid systems

Applied Surface Science

Volumn 256, Issue 3, 2009, Pages 640-644

  Balevicius, Z ^a   Vaicikauskas, V ^a   Babonas, G J ^a  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

Author keywords

Octadecanethiole; Self assembled monolayers; Spectroscopic ellipsometry; Surface plasmons; Total internal reflection ellipsometry

Indexed keywords

HYBRID SYSTEMS; MICROSTRUCTURE; REFRACTIVE INDEX; SELF ASSEMBLED MONOLAYERS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PLASMONS; THIN FILMS;

ADEQUATE MODELS; AU FILM; AU THIN FILMS; OCTADECANETHIOLE; OPTICAL PARAMETER; TOTAL INTERNAL REFLECTION ELLIPSOMETRY;

SURFACE ROUGHNESS;

EID: 71749086830     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.08.033     Document Type: Article

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