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Volumn 7518, Issue , 2009, Pages

Structural and optical properties of Bi2VO5.5 thin films deposited on silicon substrates

Author keywords

BVO; c preferred orientation; Optical properties; Sol gel method

Indexed keywords

ANNEALING PROCESS; BVO; ELLIPSOMETRIC MEASUREMENTS; EXTINCTION COEFFICIENTS; OPTICAL APPLICATIONS; P-TYPE SI; POST ANNEALING; POTENTIAL APPLICATIONS; PREFERRED ORIENTATIONS; RAMAN SPECTRA; SILICON SUBSTRATES; SOL-GEL METHODS; STRUCTURAL AND OPTICAL PROPERTIES;

EID: 71449114246     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.843213     Document Type: Conference Paper
Times cited : (1)

References (15)
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    • 5.5 (0 ≤ x ≤ 0.4) thin films fabricated by pulsed laser deposition technique" , Sci. Eng. B 153, 36-46 (2008).
  • 11
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    • 3/Si thin films , 63 1535-1537 (2009).
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  • 15
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    • Spectroscopic ellipsometry study of thin film thermo-optical properties
    • H. Xie, F.L. Ng, X.T. Zeng, "Spectroscopic ellipsometry study of thin film thermo-optical properties" , Thin Solid Films 517, 5066-5069 (2009).
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    • Xie, H.1    Ng, F.L.2    Zeng, X.T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.