Structural and optical properties of Bi2VO5.5 thin films deposited on silicon substrates

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7518, Issue , 2009, Pages

  Zhang, Zhenlun ^a   Liu, Zhipeng ^a   Guo, Ming ^a   Yang, Pingxiong ^a  

^a EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

BVO; c preferred orientation; Optical properties; Sol gel method

Indexed keywords

ANNEALING PROCESS; BVO; ELLIPSOMETRIC MEASUREMENTS; EXTINCTION COEFFICIENTS; OPTICAL APPLICATIONS; P-TYPE SI; POST ANNEALING; POTENTIAL APPLICATIONS; PREFERRED ORIENTATIONS; RAMAN SPECTRA; SILICON SUBSTRATES; SOL-GEL METHODS; STRUCTURAL AND OPTICAL PROPERTIES;

ANNEALING; ATOMIC FORCE MICROSCOPY; BIOINFORMATICS; GELS; LATTICE VIBRATIONS; LIGHT REFRACTION; LIGHTING; OPTICAL CONSTANTS; OPTICAL INSTRUMENTS; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SILICON COMPOUNDS; SOL-GEL PROCESS; SOL-GELS; SOLAR CELLS; SOLS; SUBSTRATES; THIN FILMS;

OPTICAL FILMS;

EID: 71449114246     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.843213     Document Type: Conference Paper

References (15)

1. J.F. Scott and C.A-Paz de Araujo, "Ferroelectric Memories" , Science 246 1400-1405 (1989),
2. C.E. Land, P.D. Thacher and G.H. Haertling, "ELECTROOPTIC CERAMICS" , Appl. Solid State Sci. 4 137-233 (1974).
3. R. Watton and M.A. Todd, Ferroelectrics 118, 279 (1991).
4. B.Aurivillius,nature (Lond) 2 519. (1950).
5. 5.5 (0 ≤ x ≤ 0.4) thin films fabricated by pulsed laser deposition technique" , Sci. Eng. B 153, 36-46 (2008).
6. N. Kumari, S.B. Krupanidhi and K.B.R. Varma, Mater. "Dielectric, impedance and ferroelectric characteristics of c-oriented bismuth vanadate films grown by pulsed laser deposition" , Sci. Eng. B 138 22-30 (2007).
7. 2/Si} substrates", Appl. Phys. A 91, 693-699 (2008).
8. 5.5 Thin Films" , Jpn. J. Appl. Phys. 40 6481-6486 (2001).
9. 5.5 by a coating pyrolysis process" , Thin Solid Films 425, 97-102 (2003).
10. 5.5)-semiconductor structure" , Solid State Commun. 137, 566-569 (2006).
11. 3/Si thin films" , 63 1535-1537 (2009).
12. 21 ceramics" , Appl. Phys. Lett, 88 152909 (2006).
13. 15 ferroelectrics " , Appl. Phys. Lett, 87, 202901 (2006).
14. 9 " J. Appl. Phys. 105, 024511 (2009).
15. H. Xie, F.L. Ng, X.T. Zeng, "Spectroscopic ellipsometry study of thin film thermo-optical properties" , Thin Solid Films 517, 5066-5069 (2009).