Lanthanum distribution and dielectric properties of intergrowth Bi 5-xLax TiNbWO15 ferroelectrics

Applied Physics Letters

Volumn 87, Issue 20, 2005, Pages 1-3

  Yi, Z G ^a,b   Li, Y X ^a   Zeng, J T ^a,b   Yang, Q B ^a   Wang, D ^a   Lu, Y Q ^a   Yin, Q R ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; DIELECTRIC PROPERTIES; LANTHANUM; PERMITTIVITY; RAMAN SCATTERING; TITANIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

DIELECTRIC SPECTROSCOPY; INTERGROWTH BISMUTH; ORTHORHOMBIC DISTORTION;

FERROELECTRIC CERAMICS;

EID: 27744532334     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2132077     Document Type: Article

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