Self-assembly and tribological property of a novel 3-Layer organic film on silicon wafer with polydopamine coating as the interlayer

Journal of Physical Chemistry C

Volumn 113, Issue 47, 2009, Pages 20429-20434

  Ou, Junfei ^a,b   Wang, Jinqing ^a   Liu, Sheng ^a,b   Zhou, Jinfang ^a   Yang, Shengrong ^a  

^a LANZHOU INSTITUTE OF CHEMICAL PHYSICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ADJACENT LAYERS; ANTIWEAR ABILITY; ATOMIC FORCE MICROSCOPES; ATR FTIR; ATTENUATED TOTAL REFLECTIONS; BOUNDARY LUBRICATIONS; CHEMICAL BONDINGS; CHEMICAL STRUCTURE; CROSSLINKED STRUCTURES; FOURIER TRANSFORM INFRARED SPECTROMETRY; HIGH FLEXIBILITY; MICRO-TRIBOLOGICAL BEHAVIOR; MULTI-STEP; ORGANIC FILMS; OUTER LAYER; POLYDOPAMINE COATING; POTENTIAL APPLICATIONS; SELF ASSEMBLY PROCESS; STRUCTURAL STABILITIES; TRIBOLOGICAL BEHAVIORS; TRIBOLOGICAL PROPERTIES; TRIBOMETERS; WATER CONTACT ANGLE MEASUREMENT;

ANGLE MEASUREMENT; CHEMICAL BONDS; CHLORINE COMPOUNDS; COATINGS; CONTACT ANGLE; CROSSLINKING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MULTILAYER FILMS; MULTILAYERS; PLASTIC FILMS; SELF ASSEMBLY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; STABILITY; THICKNESS MEASUREMENT; TRIBOLOGY;

WAFER BONDING;

EID: 71049138051     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp9073416     Document Type: Article

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