Lubricant effect on noncontact-mode atomic force microscopy images of hard-disk surfaces

Langmuir

Volumn 14, Issue 5, 1998, Pages 1263-1271

  Bao, Guangwen ^a   Li, Sam Fong Yau ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAIN BOUNDARIES; LIQUIDS; LUBRICANTS; ORGANIC POLYMERS; SURFACES;

HARD DISK SURFACES; NONCONTACT MODE ATOMIC FORCE MICROSCOPY; PERFLUOROPOLYETHER;

ULTRATHIN FILMS;

EID: 0032477980     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9708344     Document Type: Article

References (30)

1. Mate, C. M. J. Appl. Phys. 1992, 72, 3084.
2. Barlow, M.; Braitburg, M.; Davis, L.; Dumm, V.; Frew, D. IEEE Trans. Magn. 1987, MAG-23 (1), 33.
3. Scarati, A. M.; Caporiccio, G. IEEE Trans. Magn. 1987, MAG-23 (1), 106.
4. Johns, K.; Corti, C.; Montagna, L.; Srinivasan, L. J. Phys. D: Appl. Phys. 1992, 25, A141.
5. Homola, A. M. In AMSE Advanced Information Storage Systems; Bhushan, B., Ed.; AMSE Press: New Yprk, 1991, Vol. 1, p 279.
6. Homola, A. M. IEEE Trans. Magn. 1996, 32, 1812.
7. Marchon, B. J.; Troemel, M. Private communications.
8. Holoma, A. M.; Mate, C. M.; Street, G. B. Mater. Res. Bull. 1990, 15, 45.
9. Mate, C. M. Phys. Rev. Lett. 1992, 68, 3323.
10. Bowden, F. P.; Tabor, D. The Friction and Lubrication of Solids; Oxford University Press: New York, 1950; p 335.
11. Bhushan, B. In Forces in Scanning Probe Methods; Guntherodt, H. J., Anselmetti, D., Meyer, E., Eds.; Kluwer Academic Publishers: Dordrecht, The Netherlands, 1994; p 81.
12. Mate, C. M.; Novotny, V. J. J. Chem. Phys. 1991, 94, 8420.
13. Toney, M. F.; Thompson, C. J. Chem. Phys. 1990, 92, 3781.
14. Segar, P. R.; Rothschild, W. J.; Ting, B. Y. In AMSE Advanced Information Storage Systems; Bhushan, B.; Ed.; ASME Press: New York, 1991; Vol. 2, p 153.
15. Mahmud, K. T.; Chawla, M. K. Solid State Technol. 1989, Sept, 135.
16. Mate, C. M.; Lorenz, M. R.; Novotny, V. J. J. Chem. Phys. 1989, 90, 7550.
17. Hu, J.; Xiao, X. D.; Ogletree, D. F.; Salmeron, M. Science, 1995, 268, 267.
18. Hu, J.; Xiao, X. D.; Salmeron, M. Appl. PhysLett. 1995, 67, 476.
19. Mate, C. M.; Lorenz, M. R.; Novotny, V. J. IEEE Trans. Magn. 1990, 26, 1225.
20. Forcada, M. L.; Jakas, M. M.; Gras-Marti, A. J. Chem. Phys. 1991, 95, 706.
21. Kaneko, R.; Oguchi, S.; Andoh, Y.; Sugimoto, L.; Dekura, T. In ASME Advanced Information Storage Systems; Bhushan, B., Ed.; ASME Press: New York, 1991; Vol. 2, p 23.
22. Kaneko, R. Tribol. Int. 1995, 28, 33.
23. AFM Imaging Modes; TopoMetrix Corp.: Santa Cara, 1993.
24. Bustamante, C.; Keller, D. Phys. Today 1995, 48 (12), 32.
25. Ho, H.; West, P. Scanning 1996, 18, 339.
26. Hartmann, U. Scanning Tunneling Microscopy III; Springer-Verlag: New York, 1993; p 351.
27. Israelachvili, J. N. Intermolecular & Surfaces Forces, 2nd ed.; Academic Press: San Diego, 1991; Chapter 15.
28. Martin, Y.; Williams, C. C.; Wickramasinghe, H. K. J. Appl. Phys. 1987, 61, 4723.
29. Patman, C. A. J.; Van der Werf, K. O.; De Grooth, B. G.; Van Hulst, N. F.; Greve, J. Appl. Phys. Lett. 1994, 64, 2454.
30. Woodward, J. T.; Zasadzinski, J. A. Langmuir 1994, 10, 1340.