The effect of film composition on the structure and mechanical properties of NiTi shape memory thin films

Surface and Coatings Technology

Volumn 204, Issue 8, 2010, Pages 1299-1304

  Sanjabi, S ^a   Barber, Z H ^b   Muir Wood, A j ^b   Clyne, T W ^b  

^a TARBIAT MODARES UNIVERSITY   (Iran)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Characterization; Film composition; NiTi thin film; Sputtering

Indexed keywords

BULK PROPERTIES; ELECTRICAL RESISTIVITY; EQUIATOMIC COMPOSITION; FILM COMPOSITION; FILM STRUCTURE; HIGH TEMPERATURE; INDENTATION DEPTH; LOW TEMPERATURES; MAGNETRON SPUTTER DEPOSITION; MARTENSITIC PHASE; MECHANICAL BEHAVIOR; NITI THIN FILM; NITI THIN FILMS; PARENT PHASE; ROOM TEMPERATURE; SHAPE MEMORY; SHAPE MEMORY THIN FILMS; SI (100) SUBSTRATE; SPHERICAL INDENTERS; SUPERELASTICITY; TRANSFORMATION TEMPERATURES; VARIABLE TEMPERATURE;

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; DEPOSITION; ELECTRIC CONDUCTIVITY; MAGNETRON SPUTTERING; MARTENSITE; MARTENSITIC TRANSFORMATIONS; NANOINDENTATION; NICKEL; STRUCTURE (COMPOSITION); SURFACE STRUCTURE; THIN FILM DEVICES; THIN FILMS; VICKERS HARDNESS TESTING;

MECHANICAL PROPERTIES;

EID: 70849086413     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2009.10.013     Document Type: Article

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