Reliability of semiconductor and gas-filled diodes for over-voltage protection exposed to ionizing radiation

Nuclear Technology and Radiation Protection

Volumn 24, Issue 2, 2009, Pages 132-137

  Stanković, Koviljka ^a   Vujisić, Miloš ^b   Dolićanin, Edin ^c  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b University of Belgrade   (Serbia)

^c UNIVERSITY OF NI   (Serbia)

Author keywords

Diodes; Nuclear radiation effects; Over voltage protection

Indexed keywords

EID: 70649096063     PISSN: 14513994     EISSN: None     Source Type: Journal    
DOI: 10.2298/NTRP0902132S     Document Type: Article

References (20)

1. Standler, R. B., Protection of Electronic Circuits from Overvoltages, Dover Publications, Mineola, N. J., USA, 2002
2. Beyer, M., Boeck, W., Möller, K., Zaengl, W., Hochspannungstechnik, Theoretische und Praktische Grundlagen, Springer-Verlag, Berlin, 1986
3. Howard, C., New Avalanche Diode for Transient Protection, Electronic Product Designs, Bloomingdale, N. J., USA, 1983
4. Osmokrović, P., Lončar, B., Stanković, S., The New Method of Determining Characteristics of Elements for Overvoltage Protection of Low-Voltage System, IEEE Transactions on Instrumentation and Measurement, 55 (2006), 1, pp. 257-265
5. Gill, K., Hall, G., MacEvoy, B., Bulk Damage Effects in Irradi ated Silicon Detectors Due to Clustered Divacancies, J. Appl. Phys., 82 (1997), 1, pp. 126-130
6. rd ROSE Work shop, DESY, Ham burg, February 12-14, 1998, Germany, DESY-Proc. 1998-02
7. Gill, K., Hall, G., Roe, S., Sotthibandhu, S., Wheadon, R., Giubellino, P., Ramello, L., Radiation Damage by Neutrons and Photons to Silicon Detectors, Nucl. Inst. and Meth., A322 (1992), 2, pp. 177-188
8. Hauschild, W., Mosch, W., Statistical Techniques for High-Voltage Engineering, IEEE Power Series 13, Peter Peregrinus Ltd., Stevenage, Hert ford shire, UK, 1992
9. Vavilov, V. S., Ukhin, N. A., Radiation Effects in Semiconductors and Semi conductor Devices, Consultants Bureau, NewYork, USA, 1977
10. nd ed., Oxford University Press, Oxford, UK, 2002
11. nd ed., an Nostrand Reinhold, New York, USA, 1992
12. Osmokrović, P., Stojanović, M., Lončar, B., Kartalović, N., Krivokapić, I., Radioactive Resistance of Elements for Over-Voltage Protection of Low-Voltage Systems, Nucl. Inst. and Meth. in Physics Re search B, 140 (1998), 1, pp. 143-151
13. Alexander, D. R., Transient Ionizing Radiation Effects in Devices and Circuits, IEEE Trans. Nucl. Sci., 50 (2003), 3, pp. 565-582
14. Vasić, A., Osmokrović, P., Lončar, B., Stanković, S., Extraction of Parameters from I-V Data for Nonideal Photodetectors: A Comparative Study, Materials Science F rum, 494 (2005), 1, pp. 83-88
15. Normand, E., Radiation Effects in Commercial Electronics, IEEE Nu clear and Space Radiation Effects Conference Short Course, July 18-24, Fuscon, Ariz., USA, 1994
16. Lončar, B., Osmokrović, P., Stojanović, M., Stanković, S., Radioactive Reliability of Programmable Memories, Japanese Journal of Applied Physics, 40 (2001), Pt. 1, No. 2B, pp. 1126-1129
17. Vasić, A., Stanković, S., Lončar, B., Influence of the Radiation Effects on Electrical Characteristics of Photodetectors, Materials Science Forum, 413 (2003), 1, pp.171-174
18. Stanković, K., Vujisić, M., Influence of Radiation Energy and Angle of Incidence on the Uncertainty in Measurements by GM Counters, Nuclear Technology & Radiation Protection, 23 (2008), 1, pp. 41-42
19. Pejović, M. M., Ristić, G., Gamma and UV Radiation Effects on Break down Voltage of Neon-filled Tube, IEEE Trans. Plasma Sci., 33 (2005), 3, pp. 1047-1052
20. Lončar, B., Osmokrović, P., Vasić, A., Stanković, S., Influence of Gamma and X Radiation on Gas-filled Surge Arrester Characteristics, IEEE Transactions on Plasma Science, 34 (2006), 4, pp. 1561-1565s