Extraction of parameters from I-V data for nonideal photodetectors: A comparative study

Materials Science Forum

Volumn 494, Issue , 2005, Pages 83-88

  Vasic A ^a   Osmokrovic P ^b   Loncar B ^c   Stankovic S ^d  

^a Faculty of Mechanical Engineering   (Serbia)

^b Faculty of Electrical Engineering   (Serbia)

^c UNIVERSITY OF BELGRADE   (Serbia)

^d UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

Diode parameters; Evaluation of methods; Extraction; I V data

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC RESISTANCE; MEASUREMENT THEORY; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICES;

DIODE PARAMETERS; EVALUATION OF METHODS; SERIES RESISTANCE;

PHOTODETECTORS;

EID: 35248852876     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-971-7.83     Document Type: Conference Paper

References (10)

1. W. Li, I. Andrienko and D. Haneman, J. Appl. Phys., Vol. 88 (2000), p. 316.
2. V. Aubry and F. Meyer, J. Appl. Physics, Vol. 76, No. 12 (1994), p. 7973.
3. V.W. Chin, M.A. Green and J.W. Storey, J. Appl. Physics, Vol. 68 (1990), p. 3470.
4. M. Lyakas, R. Zaharia and M. Eizenberg, J. Appl. Phys., Vol. 78 (1995), p. 5481.
5. C.D.Lien, F.C.T. So and M.A. Nicolet, IEEE Trans. Electron Devices, ED-31,1502 (1984).
6. D. Donoval, J. de Sousa Pires, P.A. Tove and R. Harman, Solid State Electron., Vol. 32 (1989), p. 961.
7. A. Tevke, C. Besikci, C. van Hoof and G. Borghs, Solid State Electron., Vol. 42 (1998), p. 1039.
8. J. Hovel, "Semiconductors and Semimetals", Academic Press, New York, (1975).
9. A. Ortiz-Conde, F.J. Garcia Sanchez, J.J. Liou, J. Andrian, R.J. Laurence and P.E. Schmidt, Solid State Electron., Vol. 38 (1995), p. 265.
10. R.J. Bennett, IEEE Trans. Electron Devices, Vol. ED-34, 935 (1987).