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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 2 B, 2001, Pages 1126-1129

Radioactive reliability of programmable memories

(4) Loncar, Boris a Osmokrovic, Predrag b Stojanovic, Marko c Stankovic, Srboljub c

a UNIVERSITY OF BELGRADE (Serbia)

b University of Belgrade (Serbia)

c UNIVERSITY OF BELGRADE (Serbia)

Author keywords

Defects; EEPROM; EPROM; Gamma radiation; Radioactive reliability

Indexed keywords

COBALT; DEFECTS; GAMMA RAYS; IRRADIATION; MOS DEVICES; RADIOACTIVITY; RELIABILITY;

ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY (EEPROM); RADIOACTIVE RELIABILITY;

PROM;

EID: 0035245630 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.1126 Document Type: Article

Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.