A benchmark characterization of the EEMBC benchmark suite

IEEE Micro

Volumn 29, Issue 5, 2009, Pages 18-29

  Poovey, Jason A ^a,c   Conte, Thomas M ^a   Levy, Markus ^b   Gal On, Shay ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b Embedded Microprocessor Benchmark Consortium ^*

^c Georgia Institute of Technology   (United States)

Author keywords

Benchmark characterization; Benchmarking; EEMBC; Embedded systems; Workload characterization

Indexed keywords

BENCHMARK CHARACTERIZATION; BENCHMARK SUITES; CHARACTERIZATION TECHNIQUES; EMBEDDED BENCHMARKS; MEASURES OF PERFORMANCE; STRESS POINTS; WORKLOAD CHARACTERIZATION;

BENCHMARKING;

EMBEDDED SYSTEMS;

EID: 70450267415     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2009.74     Document Type: Article

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