|
Volumn 16, Issue 5, 2009, Pages 731-736
|
Raman, dielectric and optical investigations of DLC thin films
|
Author keywords
DLC; Hardness; Optical; Raman scattering; Thin film
|
Indexed keywords
A-C:H THIN FILM;
CVD METHOD;
DIAMOND-LIKE CARBON;
DIELECTRIC INDICES;
DLC THIN FILMS;
FTIR;
FTIR SPECTROSCOPY;
G-MODES;
IMAGINARY PARTS;
KRAMERS-KRONIG DISPERSION;
OPTICAL;
OPTICAL INVESTIGATION;
OPTICAL PARAMETER;
OPTICAL RAMAN;
REFLECTION SPECTROSCOPY;
SEM IMAGING;
SPECTRAL REGION;
WAVE NUMBERS;
AMORPHOUS CARBON;
CARBON FILMS;
CHEMICAL VAPOR DEPOSITION;
DIAMOND FILMS;
DIAMOND LIKE CARBON FILMS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HARDNESS;
OPTICAL VARIABLES CONTROL;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SCATTERING;
THIN FILM DEVICES;
THIN FILMS;
AMORPHOUS FILMS;
|
EID: 70450191885
PISSN: 0218625X
EISSN: None
Source Type: Journal
DOI: 10.1142/S0218625X09013190 Document Type: Article |
Times cited : (5)
|
References (20)
|