Improved performance of an ultrastable measurement platform using a field-programmable gate array for real-time deterministic control

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7042, Issue , 2008, Pages

  Churnside, Allison B ^a   King, Gavin M ^a   Carter, Ashley R ^a   Perkins, Thomas T ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

Atomic force microscopy; Optical traps; Optical tweezers; Scanning probe microscopy

Indexed keywords

FIELD PROGRAMMABLE GATE ARRAYS (FPGA); INSTRUMENTS; LOGIC GATES; MICROSCOPIC EXAMINATION; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; OPTICAL TWEEZERS; PIEZOELECTRICITY; RESONANCE; SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SIGNAL PROCESSING; THREE DIMENSIONAL;

ACQUISITION PROGRAMS; ATOMIC FORCE MICROSCOPY; FEEDBACK LOOPS; FEEDBACK RATES; FIELD-PROGRAMMABLE GATE ARRAYS; GENERAL SOLUTIONS; IMPROVED PERFORMANCES; LATERAL STABILITIES; LIMITED BANDWIDTHS; OPTICAL TRAPS; ORTHOGONAL SCANNING; PRECISION MEASUREMENTS; RESONANCE FREQUENCIES; ROOM TEMPERATURES; SCANNING PROBES; THREE DIMENSIONS;

FEEDBACK;

EID: 56249118376     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.795700     Document Type: Conference Paper

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