Confocal fluorescence microscopy in alumina-based ceramics: Where does the signal come from?

Journal of the European Ceramic Society

Volumn 30, Issue 3, 2010, Pages 641-648

  Guo, Sheng ^a   Todd, Richard I ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Al2O3; Fluorescence microscopy; Residual stress; Spectroscopy

Indexed keywords

AL2O3; CONFOCAL FLUORESCENCE MICROSCOPE; CONFOCAL FLUORESCENCE MICROSCOPY; DEPTH RESOLUTION; HIGH RESOLUTION; NEAR-SURFACE MEASUREMENTS; PHYSICAL EFFECTS; PHYSICAL SIGNIFICANCE; POLYCRYSTALLINE ALUMINA; PROBE RESPONSE FUNCTIONS; SCATTERING AND ABSORPTION;

ABSORPTION; CERAMIC MATERIALS; CHROMIUM; CORUNDUM; FLUORESCENCE MICROSCOPY; GRAIN BOUNDARIES; RESIDUAL STRESSES; SILICON CARBIDE; SINGLE CRYSTALS; SURFACE MEASUREMENT;

FLUORESCENCE;

EID: 70449589960     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2009.08.020     Document Type: Article

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