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Journal of Raman Spectroscopy

Volumn 33, Issue 10, 2002, Pages 815-828

In-depth analyses by confocal Raman microspectrometry: Experimental features and modeling of the refraction effects

(3) Bruneel, J L a Lassegues J C a Sourisseau, C a

a UNIVERSITÉ DE BORDEAUX (France)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); REFRACTION;

AXIAL RESOLUTIONS; CONFOCAL RAMAN; FOCAL DEPTH; IN-DEPTH ANALYSIS; INTENSITY RESOLUTIONS; PLANAR INTERFACE; RAMAN INTENSITIES; RAMAN MICROSPECTROMETRY; REFRACTION EFFECTS; REFRACTION INDEX;

SILICON WAFERS;

POLYETHYLENE;

ABSORPTION; ARTICLE; DIFFRACTION; FILM; LIGHT REFRACTION; MATHEMATICAL ANALYSIS; PARAMETER; PREDICTION; RAMAN SPECTROMETRY; THEORY; THICKNESS;

EID: 0036773180 PISSN: 03770486 EISSN: None Source Type: Journal
DOI: 10.1002/jrs.915 Document Type: Article

Times cited : (116)

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