Piezospectroscopic measurement of the stress field around an indentation crack tip in ruby using SEM cathodoluminescence

Journal of the European Ceramic Society

Volumn 28, Issue 10, 2008, Pages 2049-2055

  Todd, R I ^a   Stowe, D ^a,b   Galloway, S ^b   Barnes, D ^a   Wilshaw, P R ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b GATAN INC   (United States)

Author keywords

Al2O3; Cathodoluminescence; Fracture; Spectroscopy; Toughness and Toughening

Indexed keywords

CATHODOLUMINESCENCE; CRACKS; CRYSTALLOGRAPHY; FRACTURE; INDENTATION; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TOUGHENING; TOUGHNESS;

PIEZOSPECTROSCOPIC MEASUREMENT; STRESS FIELD; WAVELENGTH SHIFT;

RUBY;

CATHODOLUMINESCENCE; CRACKS; CRYSTALLOGRAPHY; FRACTURE; INDENTATION; RUBY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TOUGHENING; TOUGHNESS;

EID: 42749090003     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2008.02.008     Document Type: Article

References (19)

1. Molis S.E., and Clarke D.R. Measurement of stresses using fluorescence in an optical microprobe. J. Am. Ceram. Soc. 73 (1990) 3189-3194
2. Belnap J.D., Tsai J.F., and Shetty D.K. Direct measurement of crack shielding in ceramics by the application of Raman microprobe spectroscopy. J. Mater. Res. 9 (1994) 3183-3193
3. Siegle D., Hoffman A., Eckey L., Thomsen C., Bertram F., Schmidt D., Rudloff D., and Hiramatsu K. Vertical strain and doping gradients in thick GaN layers. Appl. Phys. Lett. 71 (1997) 2490-2492
4. Lei H., Leipner H.S., Schreiber J., Weyher J.L., Wosiński T., and Grzegory I. Raman and cathodoluminescence study of dislocations in GaN. J. Appl. Phys. 92 (2002) 6666-6670
5. 1-xN films with microcracks. Appl. Phys. Lett. 82 (2003) 367-369
6. 3+-doped optical fibres. J. Phys.: Condens. Matter 15 (2003) 7687-7695
7. Ostertag C.P., Robins L.H., and Cook L.P. Cathodoluminescence measurement of strained alumina single crystals. J. Eur. Ceram. Soc. 7 (1991) 109-116
8. Pezzotti G., Leto A., Yamada K., and Porporati A.A. Electro-stimulated piezo-spectroscopy for measuring nano-scale residual stress fields in ceramics. Adv. Sci. Tech. 45 (2006) 1658-1663
9. He J., and Clarke D.R. Determination of the piezospectroscopic coefficients for chromium-doped sapphire. J. Am. Ceram. Soc. 78 (1995) 1347-1353
10. Sih G.C., Paris P.C., and Irwin G.R. On cracks in rectilinearly anisotropic bodies. Int. J. Fract. Mech. 1 (1965) 189-203
11. Wachtman J.B., Tefft W.E., Lam D., and Stinchfield R.P. Elastic constants of synthetic single crystal corundum at room temperature. J. Res. Nat. Bur. Stand. 64A (1960) 213-228
12. D. Barnes, High resolution stress measurement in structural ceramics using photo- and cathodo-luminescence, Part II Thesis, University of Oxford 2006.
13. M. Iwasa and T. Ueno, Fracture toughness of quartz and sapphire single crystals at room temperature" Zairyo, vol. 30, no. 337 (1981) 1001-1004.
14. Wiederhorn S.M. In: Wachtman Jr. J.B. (Ed). Mechanical and Thermal Properties of Ceramics 303 (1969), N.B.S. Special Publication 217-241
15. Anstis G.R., Chantikul P., Lawn B.R., and Marshall D.B. A critical evaluation of indentation techniques for measuring fracture toughness: I, direct crack measurements. J. Am. Ceram. Soc. 64 (1981) 533-539
16. Chantikul P., Anstis G.R., Lawn B.R., and Marshall D.B. A critical evaluation of indentation techniques for measuring fracture toughness: I, strength method. J. Am. Ceram. Soc. 64 (1981) 539-543
17. Everhart T.E., and Hoff P.H. Determination of kilovolt electron energy dissipation vs penetration distance in solid materials. J. App. Phys. 42 (1971) 5837-5846
18. Lee D.W., and Kingery W.D. Radiation energy transfer and thermal conductivity of ceramic oxides. J. Am. Ceram. Soc. 43 (1960) 594-607
19. Selsing J. Internal stresses in ceramics. J. Am. Ceram. Soc. 44 (1961) 419