|
Volumn 30, Issue 2, 2010, Pages 485-488
|
Preparation of ultrathin PZT films by a chemical solution deposition method from a polymeric citrate precursor
|
Author keywords
Electron microscopy; Films; Precursors organic; PZT
|
Indexed keywords
AFM;
AMORPHOUS SILICA;
ANNEALING TIME;
CHEMICAL SOLUTION DEPOSITION METHOD;
CITRATE PRECURSOR;
COMPOSITIONAL VARIATION;
ELECTRON ENERGIES;
GRAZING-INCIDENCE X-RAY DIFFRACTION;
HIGH TEMPERATURE;
MICROSTRUCTURAL INSTABILITY;
POLYCRYSTALLINE STRUCTURE;
PRECURSORS-ORGANIC;
PZT;
PZT FILM;
SI(1 0 0);
SPHERICAL CRYSTALLITES;
THICK LAYERS;
ULTRA-THIN;
AMORPHOUS MATERIALS;
AMORPHOUS SILICON;
ANNEALING;
CHEMICALS;
PIEZOELECTRIC ACTUATORS;
PIEZOELECTRIC MATERIALS;
PIEZOELECTRIC TRANSDUCERS;
POLYMERS;
SEMICONDUCTING LEAD COMPOUNDS;
SILICA;
SUBSTRATES;
ULTRATHIN FILMS;
FILM PREPARATION;
|
EID: 70449519170
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2009.07.023 Document Type: Article |
Times cited : (6)
|
References (12)
|