Ferroelectric properties of bilayer structured Pb(Zr 0.52 Ti 0.48 )O 3 /SrBi 2 Ta 2 O 9 (PZT/SBT) thin films on Pt/TiO 2 /SiO 2 /Si substrates

Applied Surface Science

Volumn 254, Issue 6, 2008, Pages 1583-1586

  Zhang, Wen Qi ^a   Li, Ai Dong ^a   Shao, Qi Yue ^a   Xia, Yi Dong ^a   Wu, Di ^a   Liu, Zhi Guo ^a   Ming, Nai Ben ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Bilayered structure; Chemical solution deposition (CSD); Pb(Zr 0.52 Ti 0.48 )O 3 (PZT); SrBi 2 Ta 2 O 9 (SBT)

Indexed keywords

FERROELECTRIC MATERIALS; LEAD COMPOUNDS; POLARIZATION; RANDOM ACCESS STORAGE; SOLUTIONS; X RAY DIFFRACTION;

BILAYERED STRUCTURE; CHEMICAL SOLUTION DEPOSITION (CSD);

FERROELECTRIC THIN FILMS;

EID: 37349024067     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.07.067     Document Type: Article

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