Masking of X-values by use of a hierarchically configurable register

Proceedings of the 14th IEEE European Test Symposium, ETS 2009

Volumn , Issue , 2009, Pages 149-154

  Rabenalt, Thomas ^a   Goessel, Michael ^a   Leininger, Andreas ^b  

^a UNIVERSITY OF POTSDAM   (Germany)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSION RATIOS; CONFIGURABLE; INDUSTRIAL DESIGN; LARGE CIRCUITS; SCAN CELLS; SCAN CHAIN; SHIFT CYCLES; TEST RESPONSE; TWO STEP METHOD; UNDEFINED STATE; X-MASKING;

COMPRESSION RATIO (MACHINERY); SCANNING;

TESTING;

EID: 70449365089     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2009.11     Document Type: Conference Paper

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