In-plane refractive-index anisotropy in porous silicon layers induced by polarized illumination during electrochemical etching

Journal of Applied Physics

Volumn 96, Issue 7, 2004, Pages 3716-3720

  Koyama, Hideki ^a  

^a HYOGO UNIVERSITY OF TEACHER EDUCATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ELECTRIC FIELD EFFECTS; ETCHING; LIGHT INTERFERENCE; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; POLARIZATION; REFRACTIVE INDEX;

INTERFERENCE FRINGES; LINEAR POLARIZATION; OPTICAL ANISOTROPY; PHOTOELECTROCHEMICAL ETCHING;

POROUS SILICON;

EID: 7044227655     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1784613     Document Type: Article

References (37)

1. L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
2. V. Lehmann and U. Gösele, Appl. Phys. Lett. 58, 856 (1991).
3. D. J. Lockwood, Solid State Commun. 92, 101 (1994).
4. A. G. Cullis, L. T. Canham, and P. D.J. Calcott, J. Appl. Phys. 82, 909 (1997).
5. V. Parkhutik, Solid-State Electron. 43, 1121 (1999).
6. O. Bisi, S. Ossicini, and L. Pavesi, Surf. Sci. Rep. 38, 1 (2000).
7. A. G. Cullis and L. T. Canham, Nature (London) 353, 335 (1991).
8. S. Schuppler et al., Phys. Rev. Lett. 72, 2648 (1994).
9. J. von Behren, T. van Buuren, M. Zacharias, E. H. Chimowitz, and P. M. Fauchet, Solid State Commun. 105, 317 (1998).
10. M. V. Wolkin, J. Jome, P. M. Fauchet, G. Allan, and C. Delerue, Phys. Rev. Lett. 82, 197 (1999).
11. N. Koshida and H. Koyama, Appl. Phys. Lett. 60, 347 (1992).
12. A. Richter, P. Steiner, F. Kozlowski, and W. Lang, IEEE Electron Device Lett. 12, 691 (1991).
13. A. Loni, A. J. Simons, T. I. Cox, P. D. J. Calcott, and L. T. Canham, Electron. Lett. 31, 1288 (1995).
14. L. Tsybeskov, S. P. Duttagupta, K. D. Hirschman, and P. M. Fauchet, Appl. Phys. Lett. 68, 2058 (1996).
15. B. Gelloz and N. Koshida, J. Appl. Phys. 88, 4319 (2000).
16. G. Vincent, Appl. Phys. Lett. 64, 2367 (1994).
17. M. G. Berger et al., J. Phys. D 27, 1333 (1994).
18. L. Pavesi and C. Mazzoleni, Appl. Phys. Lett. 67, 2983 (1995).
19. M. Araki, H. Koyama, and N. Koshida, J. Appl. Phys. 80, 4841 (1996).
20. A. Bsiesy et al., Surf. Sci. 254, 195 (1991).
21. H. Koyama and N. Koshida, J. Appl. Phys. 74, 6365 (1993).
22. H. Mizuno, H. Koyama, and N. Koshida, Appl. Phys. Lett. 69, 3779 (1996).
23. F. Ferrieu, A. Halimaoui, and D. Bensahel, Solid State Commun. 84, 293 (1992).
24. I. Mihalcescu, G. Lerondel, and R. Romestain, Thin Solid Films 297, 245 (1997).
25. C. J. Oton, Z. Gaburro, M. Ghulinyan, L. Pancheri, P. Boettotti, L. Dal Negro, and L. Pavesi, Appl. Phys. Lett. 81, 4919 (2002).
26. D. Kovalev, M. Ben Chorin, J. Diener, F. Koch, Al. L. Efros, M. Rosen, N. A. Gippius, and S. G. Tikhodeev, Appl. Phys. Lett. 67, 1585 (1995).
27. O. G. Sarbey, E. K. Frolova, R. D. Fedorovich, and D. B. Dan'ko, Phys. Solid State 42, 1205 (2000).
28. D. Kovalev, G. Polisski, J. Diener, H. Heckler, N. Künzner, V. Yu. Timoshenko, and F. Koch, Appl. Phys. Lett. 78, 916 (2001).
29. G. Polisski, B. Averboukh, D. Kovalev, and F. Koch, Mater. Res. Soc. Symp. Proc. 452, 541 (1997).
30. J. Diener, N. Künzner, D. Kovalev, E. Gross, F. Koch, and M. Fujii, J. Appl. Phys. 91, 6704 (2002).
31. G. Polisski, B. Averboukh, D. Kovalev, and F. Koch, Appl. Phys. Lett. 70, 1116 (1997).
32. H. Koyama, Appl. Phys. Lett. 80, 965 (2002).
33. H. Koyama, J. Appl. Phys. 93, 2410 (2003).
34. H. Koyama, in Recent Research Developments in Applied Physics, edited by S. G. Pandalai (Transworld Research Network, Trivandrum, India, 2003), Vol. 6, Part 1, p. 373.
35. H. Koyama, T. Nakagawa, T. Ozaki, and N. Koshida, Appl. Phys. Lett. 65, 1656 (1994).
36. H. Koyama and P. M. Fauchet, Appl. Phys. Lett. 77, 2316 (2000).
37. M. Fox, Optical Properties of Solids (Oxford University Press, Oxford, 2001).