Strong in-plane birefringence of spatially nanostructured silicon

Applied Physics Letters

Volumn 78, Issue 7, 2001, Pages 916-918

  Kovalev, D ^a   Polisski, G ^a   Diener, J ^a   Heckler, H ^a   Kunzner N ^a   Timoshenko, V Yu ^a,b   Koch, F ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000648685     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1343476     Document Type: Article

References (14)

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