Enhanced magnetization in BiFeO3/BaTiO3 multilayers: An interface effect?

Integrated Ferroelectrics

Volumn 100, Issue 1, 2008, Pages 165-176

  Toupet, H ^a   Shvartsman, V V ^b   Lemarrec, F ^a   Borisov, P ^b   Kleemann, W ^b   Karkut, M ^a  

^a Universite de Picardie Jules Verne   (France)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Antiferromagnetic susceptibility; BiFeO3 thin films; Multiferroics; Multilayers; Pulsed laser deposition; X ray diffraction

Indexed keywords

ANTIFERROMAGNETICS; BIFEO3 THIN FILM; INTERFACE EFFECT; MODULATION PERIOD; MULTIFERROICS; PER UNIT VOLUME; SQUID MAGNETOMETERS; SRTIO; X-RAY DIFFRACTION MEASUREMENTS;

ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRON DIFFRACTION; FILM PREPARATION; MAGNETIC SUSCEPTIBILITY; MAGNETOMETERS; PULSED LASER DEPOSITION; PULSED LASERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

MULTILAYERS;

EID: 70350677774     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/10584580802541023     Document Type: Conference Paper

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