Effects of chemical fluctuations on microstructures and properties of multiferroic BiFeO3 thin films

Applied Physics Letters

Volumn 91, Issue 8, 2007, Pages

  Luo, W B ^a   Zhu, J ^a   Li, Y R ^a   Wang, X P ^a   Zhao, D ^a   Xiong, J ^a   Zhang, Y ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; FERROELECTRICITY; MICROSTRUCTURE; PULSED LASER DEPOSITION; SATURATION MAGNETIZATION; SURFACE CHEMISTRY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL FLUCTUATIONS; FERROELECTRIC HYSTERESIS LOOP;

THIN FILMS;

EID: 34548235527     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2771089     Document Type: Article

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