Effect of atomic force microscope tip geometry on the evaluation of the crystal size of semicrystalline polymers

Measurement Science and Technology

Volumn 20, Issue 9, 2009, Pages

  Zia, Qamer ^a   Androsch, René ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

Atomic force microscopy; Crystal size; Semicrystalline polymers; Tip geometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; GEOMETRY; GRAIN SIZE AND SHAPE; POLYMERS; POLYPROPYLENES;

CRYSTAL SIZE; HIGH RESOLUTION; ISOTACTIC POLYPROPYLENE; NANO-METER SCALE; POLYMER CRYSTALS; SEMI-CRYSTALLINE POLYMER; SILICON TIPS; TIP GEOMETRY;

CRYSTAL ATOMIC STRUCTURE;

EID: 70350656338     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/9/097003     Document Type: Article

References (29)

1. Strobl G 2007 The Physics of Polymers (Berlin: Springer)
2. Wunderlich B 1973 Macromolecular Physics, Volume 1, Crystal Structure, Morphology, Defects (New York: Academic)
3. Hsu C C, Geil P H, Miyaji H and Asai K 1986 Structure and properties of polypropylene crystallized from the glassy state J. Polym. Sci. Polym. Phys. 24 2379-401
4. Zia Q, Androsch R, Radusch H J and Piccarolo S 2006 Morphology, reorganization and stability of mesomorphic nanocrystals in isotactic polypropylene Polymer 47 8163-72
5. Elias H G 2008 Macromolecules, Volume 3, Physical Structures and Properties (Weinheim: Wiley VCH)
6. Zia Q, Androsch R, Radusch H J and Ingoli E 2008 Crystal morphology of rapidly cooled isotactic polypropylene: a comparative study by TEM and AFM Polym. Bull. 60 791-8
7. Montezinos D, Wells B G and Burns J L 1985 The use of ruthenium in hypochlorite as a stain for polymeric materials J. Polym. Sci. Polym. Lett. 23 421-5
8. Zhou H and Wilkes G H 1997 Comparison of lamellar thickness and its distribution determined from d.s.c., SAXS, TEM and AFM for high-density polyethylene films having a stacked lamellar morphology Polymer 23 5735-47
9. Stocker W, Beckmann J, Stadler R and Rabe J P 1996 Surface reconstruction of the lamellar morphology in a symmetric poly(styrene-block-butadiene-block- methyl methacrylate) triblock copolymer: a tapping mode scanning force microscope study Macromolecules 29 7502-7
10. Ramirez-Aguilar K A and Rowlen K L 1998 Tip characterization from AFM images of nanometric spherical particles Langmuir 14 2562-6
11. Wunderlich B 2003 Reversible crystallization and the rigid-amorphous phase in semicrystalline macromolecules Prog. Polym. Sci. 28 383-450
12. Zia Q, Mileva D and Androsch R 2009 The rigid amorphous fraction in isotactic polypropylene Macromolecules 41 8095-102
13. Howald L, Haefke H, Lüthi R, Meyer E, Gerth G, Rudin H and Güntherodt H J 1994 Ultrahigh-vacuum scanning force microscopy: atomic-scale resolution at monatomic cleavage steps Phys. Rev. B 49 5651-6
14. Magonov S N and Reneker D H 1997 Characterization of polymer surfaces with atomic force microscopy Ann. Rev. Mater. Sci. 27 175-222
15. Tranchida D, Piccarolo S and Deblieck R A C 2006 Some experimental issues of AFM tip blind estimation: the effect of noise and resolution Meas. Sci. Technol. 17 2630-6
16. Sawyer L C, Grubb D T and Meyers G F 2008 Polymer Microscopy 3rd edn (New York: Springer)
17. Yang D Q, Xiong Y Q, Guo Y, Da D A and Lu W G 2001 Sizes correction on AFM images of nanometer spherical particles J. Mater. Sci. 36 263-7
18. Markiewicz P and Goh M C 1994 Atomic force microscopy probe tip visualization and improvement of images using a simple deconvolution procedure Langmuir 10 5-7
19. Dongmo S, Vautrot P, Bonnet N and Troyon M 1998 Correction of surface roughness measurements in SPM imaging Appl. Phys. A 66 S819-23
20. Kado H, Yokoyama K and Tohda T 1992 Atomic force microscopy using ZnO whisker tip Rev. Sci. Instrum. 63 3330-2
21. Kado H, Yokoyama K and Tohda T 1992 A novel ZnO whisker tip for atomic force microscopy Ultramicroscopy 42-44 1659-63
22. Martinez J, Yuzvinsky T D, Fennimore A M, Zett A, García R and Bustamante C 2005 Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam Nanotechnology 16 2493-6
23. Bunch J S, Rhodin T N and McEuen P L 2004 Noncontact-AFM imaging of molecular surfaces using single-wall carbon nanotube technology Nanotechnology 15 S76-8
24. Martinez R V, Losilla N S, Martinez J, Huttel Y and Garcia R 2007 Patterning polymeric structures with 2 nm resolution at 3 nm half pitch in ambient conditions Nano Lett. 7 1846-50
25. Martinez J, Martinez R V and Garcia R 2008 Silicon nanowire transistors with a channel width of 4 nm fabricated by atomic force microscope nanolithography Nano Lett. 8 3636-9
26. Brucato V, Piccarolo S and La Carrubba V 2002 An experimental methodology to study polymer crystallization under processing conditions: the influence of high cooling rates Chem. Eng. Sci. 57 4129-43
27. Zia Q, Radusch H J and Androsch R 2007 Direct analysis of annealing of nodular crystals in isotactic polypropylene by atomic force microscopy, and its correlation with calorimetric data Polymer 48 3504-11
28. Product information, MikroMasch http://www.spmtips.com
29. Keller D 1991 Reconstruction of STM and AFM images distorted by finite-size tips Surf. Sci. 253 353-64