Detection of sub-ppm traces of aqueous heavy-metal ions using micro-electro-mechanical beam resonators

Journal of Micromechanics and Microengineering

Volumn 19, Issue 11, 2009, Pages

  Rahafrooz, Amir ^a   Pourkamali, Siavash ^a  

^a University of Denver   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL MODEL; AQUEOUS METAL IONS; ATOMIC LAYER; BEAM RESONATORS; COPPER CONCENTRATION; COPPER IONS; COPPER LAYER; FREQUENCY SHIFT; MASS SENSITIVITY; MICRO-ELECTRO-MECHANICAL; MICROMECHANICAL RESONATOR; RESONANT FREQUENCIES; RESONANT STRUCTURES; SENSITIVE MASS; THIN METAL LAYERS; TRACE AMOUNTS; WATER SAMPLES;

COPPER; FREQUENCY SHIFT KEYING; METAL IONS; NATURAL FREQUENCIES; OXIDE MINERALS; QUARTZ; QUARTZ CRYSTAL MICROBALANCES; RESONATORS; TRACE ANALYSIS;

COPPER COMPOUNDS;

EID: 70350639494     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/19/11/115003     Document Type: Article

References (11)

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