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Volumn 487, Issue 1-2, 2009, Pages 280-285
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The influence of substrate temperature on the morphology, optical and electrical properties of thermal-evaporated ZnSe thin films
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Author keywords
Annealing temperature; Electrical resistivity; Optical band gap; Substrate temperature; Vacuum evaporation; ZnSe thin films
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Indexed keywords
ANNEALING TEMPERATURE;
DIRECT TRANSITION;
ELECTRICAL RESISTIVITY;
GRAIN SIZE;
MORPHOLOGICAL CHANGES;
OPTICAL AND ELECTRICAL PROPERTIES;
OPTICAL BAND GAP ENERGY;
POLYCRYSTALLINE;
POST DEPOSITION ANNEALING;
ROOM-TEMPERATURE RESISTIVITY;
SEM STUDY;
SPIN-ORBIT SPLITTINGS;
STRUCTURE ZONE MODEL;
SUBSTRATE TEMPERATURE;
XRD STUDIES;
ZINC-BLENDE;
ZNSE FILMS;
ZNSE THIN FILMS;
ANNEALING;
ELECTRIC CONDUCTIVITY;
ENERGY GAP;
GRAIN GROWTH;
GRAIN SIZE AND SHAPE;
MORPHOLOGY;
OPTICAL BAND GAPS;
OPTICAL PROPERTIES;
SEMICONDUCTING ZINC COMPOUNDS;
SUBSTRATES;
THIN FILMS;
VACUUM;
VAPORS;
ZINC;
VACUUM EVAPORATION;
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EID: 70350619726
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.07.102 Document Type: Article |
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Times cited : (50)
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References (27)
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