Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti 0.6O3 epitaxial multilayers

Journal of Physics D: Applied Physics

Volumn 42, Issue 8, 2009, Pages

  Feigl, L ^a   Zheng, S J ^b   Birajdar, B I ^a   Rodriguez, B J ^a   Zhu, Y L ^a,b   Alexe, M ^a   Hesse, D ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b INSTITUTE OF METAL RESEARCH   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CONSTANTS; ELECTRICAL PROPERTY; EPITAXIAL MULTILAYERS; HIGH RESOLUTION; INTERFACE DENSITY; LATTICE DISTORTIONS; LAYER THICKNESS; MULTILAYER STRUCTURES; PIEZORESPONSE FORCE MICROSCOPY; RECIPROCAL SPACE MAPPING; REMANENT POLARIZATION; SRTIO; STRAIN STATE; STRUCTURAL INVESTIGATION;

ELECTRIC PROPERTIES; MULTILAYERS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 70350470006     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/8/085305     Document Type: Article

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