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Volumn 95, Issue 16, 2009, Pages

Large excess volume in grain boundaries of stressed, nanocrystalline metallic thin films: Its effect on grain-growth kinetics

(4) Kuru, Y a Wohlschlogel M a Welzel, U a Mittemeijer, E J a

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXCESS VOLUME; IN-SITU; METALLIC THIN FILMS; NANOCRYSTALLINES; NI THIN FILMS; PER UNIT; REAL TIME;

GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; GROWTH KINETICS; NANOCRYSTALLINE MATERIALS; PALLADIUM; THIN FILMS;

GRAIN GROWTH;

EID: 70350391653 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3248070 Document Type: Article

Times cited : (33)

References (29)

1
- 84973066527
- 0141-1594,. 10.1080/01411599008210226
- H. Gleiter, Phase Transitions 0141-1594 24, 15 (1990). 10.1080/01411599008210226
- (1990) Phase Transitions , vol.24 , pp. 15
- Gleiter, H.¹

2
- 0004808527
- (Pergamon, New York).
- R. Birringer and H. Gleiter, Advances in Materials Science, Encyclopedia of Materials Science and Engineering (Pergamon, New York, 1988).
- (1988) Advances in Materials Science, Encyclopedia of Materials Science and Engineering
- Birringer, R.¹ Gleiter, H.²

3
- 0011443424
- 1476-1122,. 10.1038/nmat700
- V. Yamakov, D. Wolf, S. R. Phillpot, A. K. Mukherjee, and H. Gleiter, Nature Mater. 1476-1122 1, 45 (2002). 10.1038/nmat700
- (2002) Nature Mater. , vol.1 , pp. 45
- Yamakov, V.¹ Wolf, D.² Phillpot, S.R.³ Mukherjee, A.K.⁴ Gleiter, H.⁵

4
- 2942642464
- 1476-1122,. 10.1038/nmat1136
- H. Van Swygenhoven, P. M. Derlet, and A. G. Froseth, Nature Mater. 1476-1122 3, 399 (2004). 10.1038/nmat1136
- (2004) Nature Mater. , vol.3 , pp. 399
- Van Swygenhoven, H.¹ Derlet, P.M.² Froseth, A.G.³

5
- 34250634092
- Crystallite size dependence of the coefficient of thermal expansion of metals
- DOI 10.1063/1.2748332
- Y. Kuru, M. Wohlschlögel, U. Welzel, and E. J. Mittemeijer, Appl. Phys. Lett. 0003-6951 90, 243113 (2007). 10.1063/1.2748332 (Pubitemid 46934825)
- (2007) Applied Physics Letters , vol.90 , Issue.24 , pp. 243113
- Kuru, Y.¹ Wohlschlogel, M.² Welzel, U.³ Mittemeijer, E.J.⁴

6
- 33845914577
- In situ investigation of the microstructure evolution in nanocrystalline copper electrodeposits at room temperature
- DOI 10.1063/1.2401647
- K. Pantleon and M. A. J. Somers, J. Appl. Phys. 0021-8979 100, 114319 (2006). 10.1063/1.2401647 (Pubitemid 46016067)
- (2006) Journal of Applied Physics , vol.100 , Issue.11 , pp. 114319
- Pantleon, K.¹ Somers, M.A.J.²

7
- 35548986144
- Microstructure stability of silver electrodeposits at room temperature
- DOI 10.1016/j.scriptamat.2007.09.033, PII S1359646207006963
- K. Hansen and K. Pantleon, Scr. Mater. 1359-6462 58, 96 (2008). 10.1016/j.scriptamat.2007.09.033 (Pubitemid 350008102)
- (2008) Scripta Materialia , vol.58 , Issue.2 , pp. 96-98
- Hansen, K.¹ Pantleon, K.²

8
- 0026940317
- Secondary recrystallization effects in nanostructured elemental metals
- DOI 10.1016/0956-716X(92)90401-Y
- B. Gunther, A. Kumpmann, and H. -D. Kunze, Scr. Metall. Mater. 0956-716X 27, 833 (1992). 10.1016/0956-716X(92)90401-Y (Pubitemid 23584830)
- (1992) Scripta metallurgica et materialia , vol.27 , Issue.7 , pp. 833-838
- Guenther, B.¹ Kumpmann, A.² Kunze, H.-D.³

9
- 0031140831
- 1359-6454,. 10.1016/S1359-6454(96)00300-X
- T. R. Malow and C. C. Koch, Acta Mater. 1359-6454 45, 2177 (1997). 10.1016/S1359-6454(96)00300-X
- (1997) Acta Mater. , vol.45 , pp. 2177
- Malow, T.R.¹ Koch, C.C.²

10
- 0035132277
- Size-dependent grain-growth kinetics observed in nanocrystalline Fe
- DOI 10.1103/PhysRevLett.86.842
- C. E. Krill, L. Helfen, D. Michels, H. Natter, A. Fitch, O. Masson, and R. Birringer, Phys. Rev. Lett. 0031-9007 86, 842 (2001). 10.1103/PhysRevLett.86. 842 (Pubitemid 32159804)
- (2001) Physical Review Letters , vol.86 , Issue.5 , pp. 842-845
- Krill III, C.E.¹ Helfen, L.² Michels, D.³ Natter, H.⁴ Fitch, A.⁵ Masson, O.⁶ Birringer, R.⁷

11
- 34748909942
- 0022-2461,. 10.1007/s10853-006-0563-0
- L. S. Shvindlerman, G. Gottstein, V. A. Ivanov, D. A. Molodov, D. Kolesnikov, and W. Lojkowski, J. Mater. Sci. 0022-2461 41, 7725 (2006). 10.1007/s10853-006-0563-0
- (2006) J. Mater. Sci. , vol.41 , pp. 7725
- Shvindlerman, L.S.¹ Gottstein, G.² Ivanov, V.A.³ Molodov, D.A.⁴ Kolesnikov, D.⁵ Lojkowski, W.⁶

12
- 0004289399
- (North-Holland, Amsterdam).
- H. J. Leamy, G. E. Pike, and C. H. Seager, Grain Boundaries in Semiconductors (North-Holland, Amsterdam, 1982).
- (1982) Grain Boundaries in Semiconductors
- Leamy, H.J.¹ Pike, G.E.² Seager, C.H.³

13
- 0017558550
- 0962-8452,. 10.1098/rspa.1977.0179
- R. C. Pond and V. Vitek, Proc. R. Soc. London, Ser. B 0962-8452 357, 453 (1977). 10.1098/rspa.1977.0179
- (1977) Proc. R. Soc. London, Ser. B , vol.357 , pp. 453
- Pond, R.C.¹ Vitek, V.²

14
- 35949010698
- 0031-9007,. 10.1103/PhysRevLett.59.2887
- K. L. Merkle and D. J. Smith, Phys. Rev. Lett. 0031-9007 59, 2887 (1987). 10.1103/PhysRevLett.59.2887
- (1987) Phys. Rev. Lett. , vol.59 , pp. 2887
- Merkle, K.L.¹ Smith, D.J.²

15
- 33645231286
- 0021-8898,. 10.1107/S0021889806000513
- M. Wohlschlögel, U. Welzel, G. Maier, and E. J. Mittemeijer, J. Appl. Crystallogr. 0021-8898 39, 194 (2006). 10.1107/S0021889806000513
- (2006) J. Appl. Crystallogr. , vol.39 , pp. 194
- Wohlschlögel, M.¹ Welzel, U.² Maier, G.³ Mittemeijer, E.J.⁴

16
- 38349164773
- 0021-8898,. 10.1107/S0021889807050005
- M. Wohlschlögel, T. U. Schülli, B. Lantz, and U. Welzel, J. Appl. Crystallogr. 0021-8898 41, 124 (2008). 10.1107/S0021889807050005
- (2008) J. Appl. Crystallogr. , vol.41 , pp. 124
- Wohlschlögel, M.¹ Schülli, T.U.² Lantz, B.³ Welzel, U.⁴

17
- 40849095121
- 10.1524/zksu.2007.2007.suppl-26.147
- M. Wohlschlögel, T. U. Schülli, G. Maier, U. Welzel, and E. J. Mittemeijer, Z. Kristallogr. Suppl. 2007, 147. 10.1524/zksu.2007.2007.suppl-26. 147
- Z. Kristallogr. Suppl. , vol.2007 , pp. 147
- Wohlschlögel, M.¹ Schülli, T.U.² Maier, G.³ Welzel, U.⁴ Mittemeijer, E.J.⁵

18
- 13944267499
- Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction
- DOI 10.1107/S0021889804029516
- U. Welzel, J. Ligot, P. Lamparter, A. C. Vermeulen, and E. J. Mittemeijer, J. Appl. Crystallogr. 0021-8898 38, 1 (2005). 10.1107/ S0021889804029516 (Pubitemid 40267677)
- (2005) Journal of Applied Crystallography , vol.38 , Issue.1 , pp. 1-29
- Welzel, U.¹ Ligot, J.² Lamparter, P.³ Vermeulen, A.C.⁴ Mittemeijer, E.J.⁵

19
- 40849133985
- 0021-8898,. 10.1107/S0021889808004792
- Y. Kuru, M. Wohlschlögel, U. Welzel, and E. J. Mittemeijer, J. Appl. Crystallogr. 0021-8898 41, 428 (2008). 10.1107/S0021889808004792
- (2008) J. Appl. Crystallogr. , vol.41 , pp. 428
- Kuru, Y.¹ Wohlschlögel, M.² Welzel, U.³ Mittemeijer, E.J.⁴

20
- 17044409754
- Simultaneous determination of experimental elastic and thermal strains in thin films
- DOI 10.1107/S0021889805001044
- J. Keckes, J. Appl. Crystallogr. 0021-8898 38, 311 (2005). 10.1107/S0021889805001044 (Pubitemid 40500475)
- (2005) Journal of Applied Crystallography , vol.38 , Issue.2 , pp. 311-318
- Keckes, J.¹

21
- 2342601217
- 10.1007/BF00482725 0016-1152
- R. Delhez, Th. H. de Keijser, and E. J. Mittemeijer, Fresenius' Z. Anal. Chem. 312, 1 (1982). 10.1007/BF00482725 0016-1152
- (1982) Fresenius' Z. Anal. Chem. , vol.312 , pp. 1
- Delhez, R.¹ De Keijser, Th.H.² Mittemeijer, E.J.³

22
- 0001461385
- 0021-8898,. 10.1107/S0021889882012035
- Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer, and A. B. P. Vogels, J. Appl. Crystallogr. 0021-8898 15, 308 (1982). 10.1107/ S0021889882012035
- (1982) J. Appl. Crystallogr. , vol.15 , pp. 308
- De Keijser, Th.H.¹ Langford, J.I.² Mittemeijer, E.J.³ Vogels, A.B.P.⁴

23
- 4043108748
- edited by E. J. Mittemeijer and P. Scardi (Springer, New York).
- Diffraction Analysis of the Microstructure of Materials, edited by, E. J. Mittemeijer, and, P. Scardi, (Springer, New York, 2004).
- (2004) Diffraction Analysis of the Microstructure of Materials

24
- 84996160008
- 10.1080/14786435608238074
- G. K. Williamson and R. E. Smallman, Philos. Mag. 1, 34 (1956). 10.1080/14786435608238074
- (1956) Philos. Mag. , vol.1 , pp. 34
- Williamson, G.K.¹ Smallman, R.E.²

25
- 0000333346
- 0022-5355,. 10.1116/1.1316674
- P. Chaudhari, J. Vac. Sci. Technol. 0022-5355 9, 520 (1972). 10.1116/1.1316674
- (1972) J. Vac. Sci. Technol. , vol.9 , pp. 520
- Chaudhari, P.¹

26
- 0024129196
- 1040-8436,. 10.1080/10408438808243734
- M. F. Doerner and W. D. Nix, Crit. Rev. Solid State Mater. Sci. 1040-8436 14, 225 (1988). 10.1080/10408438808243734
- (1988) Crit. Rev. Solid State Mater. Sci. , vol.14 , pp. 225
- Doerner, M.F.¹ Nix, W.D.²

27
- 0001117817
- 0927-7056.
- M. Upmanyu, D. J. Srolovitz, L. S. Shvindlerman, and G. Gottstein, Interface Sci. 0927-7056 6, 287 (1998).
- (1998) Interface Sci. , vol.6 , pp. 287
- Upmanyu, M.¹ Srolovitz, D.J.² Shvindlerman, L.S.³ Gottstein, G.⁴

28
- 0035091749
- Grain growth in thin metallic films
- DOI 10.1016/S1359-6454(00)00344-X
- Y. Estrin, G. Gottstein, E. Rabkin, and L. S. Shvindlerman, Acta Mater. 1359-6454 49, 673 (2001). 10.1016/S1359-6454(00)00344-X (Pubitemid 32196547)
- (2001) Acta Materialia , vol.49 , Issue.4 , pp. 673-681
- Estrin, Y.¹ Gottstein, G.² Rabkin, E.³ Shvindlerman, L.S.⁴

29
- 0037154070
- On the mechanisms of grain boundary migration
- DOI 10.1016/S1359-6454(01)00343-3, PII S1359645401003433
- M. Winning, G. Gottstein, and L. S. Shvindlerman, Acta Mater. 1359-6454 50, 353 (2002). 10.1016/S1359-6454(01)00343-3 (Pubitemid 34040553)
- (2002) Acta Materialia , vol.50 , Issue.2 , pp. 353-363
- Winning, M.¹ Gottstein, G.² Shvindlerman, L.S.³

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