Confocal microscopy and spectroscopy of defect photoluminescence in single SiO2 nanoparticles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7393, Issue , 2009, Pages

  Chizhik, Anna M ^a   Schmidt, Torsten ^b   Chizhik, Alexey I ^a   Huisken, Friedrich ^b   Meixner, Alfred ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Confocal microscopy; Doughnut laser modes; Fluorescence microscopy; Higher order laser modes; Nanomaterials; Silica nanoparticles; Silicon Nanoparticles; Single nanoparticle microscopy; Single nanoparticle spectroscopy

Indexed keywords

DOUGHNUT LASER MODES; HIGHER ORDER LASER MODES; NANOMATERIALS; SILICA NANOPARTICLES; SILICON NANOPARTICLES; SINGLE NANOPARTICLE MICROSCOPY; SINGLE NANOPARTICLE SPECTROSCOPY;

CONFOCAL MICROSCOPY; FLUORESCENCE; FLUORESCENCE MICROSCOPY; LASER MODES; NANOCRYSTALS; NANOPHOTONICS; NANOSTRUCTURED MATERIALS; OXIDE MINERALS; PHONONS; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; QUARTZ; SILANES; SILICA; SILICON OXIDES; SURFACE PLASMON RESONANCE; TIME DIVISION MULTIPLEXING;

NANOPARTICLES;

EID: 70350389220     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.825288     Document Type: Conference Paper

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