Synchrotron characterization of texture and stress evolution in Ag films

Materials Research Society Symposium Proceedings

Volumn 1027, Issue , 2008, Pages 1-6

  Vodnick, Aaron ^a   Lawrence, Michael ^a   Little, Bethany ^b   Worden, Derek ^b   Baker, Shefford ^a  

^a Cornell University   (United States)

^b HOUGHTON COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AG FILMS; AS-DEPOSITED FILMS; AVRAMI ANALYSIS; BARRIER LAYERS; COMMON MODELS; CORNELL HIGH-ENERGY SYNCHROTRON SOURCES; DRIVING FORCES; FIBER TEXTURE; IN-SITU SYNCHROTRONS; ISOTHERMAL ANNEALS; METAL FILM; NUCLEATION PROCESS; REAL TIME; SECONDARY GRAIN GROWTH; STRAIN-FREE; STRESS EVOLUTION; TEXTURE COMPONENTS; TEXTURE EVOLUTIONS; TEXTURE TRANSFORMATION; X-RAY DIFFRACTION MEASUREMENTS;

ACTIVATION ANALYSIS; ACTIVATION ENERGY; DIFFRACTION; GRAIN GROWTH; NEUTRON SOURCES; SILVER; STRAIN; SYNCHROTRONS; X RAY DIFFRACTION;

TEXTURES;

EID: 70350336703     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. C. V. Thompson,Annu. Rev. Mater. Sci. 30, 159 (2000).
2. P. Sonnweber-Ribic, P. Gruber, G. Dehm, and E. Arzt,Acta Mater. 54, 3863 (2006).
3. C. V. Thompson and R. Carel,J Mech Phys Solids 44, 657 (1996).
4. A. M. Vodnick, D. E. Nowak, and S. P. Baker,to be submitted (2008).
5. A. S. Ozcan, K. F. Ludwig, C. Lavoie, C. Cabral, J. M. E. Harper, and R. M. Bradley,J. Appl. Phys. 92, 5189 (2002).
6. S. P. Baker, A. Kretschmann, and E. Arzt,Acta Mater. 49, 2145 (2001).
7. E. M. Zielinski, R. P. Vinci, and J. C. Bravman.Appl. Phys. Lett. 67, 1078 (1995).
8. D. E. Nowak, et al.,Rev. Sci. Instrum. 77, 113301 (2006).
9. R. P. Vinci, E M. Zielinski, and J. C. Bravman,Thin Solid Films 262,142 (1995).
10. D. A. Porter and K. E. Easterling, Phase Transformations in Metals and Alloys (Chapman & Hall, 1992).