메뉴 건너뛰기




Volumn 54, Issue 15, 2006, Pages 3863-3870

Erratum to "Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction" [Acta Mater 54 (2006) 3863-3870] (DOI:10.1016/j.actamat.2006.03.057);Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction

Author keywords

Copper; EBSD; Texture; Thin films; XRD

Indexed keywords

COPPER; ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; TEXTURES; X RAY DIFFRACTION ANALYSIS; YIELD STRESS;

EID: 33746861948     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.10.001     Document Type: Erratum
Times cited : (74)

References (21)
  • 12
    • 33746801404 scopus 로고    scopus 로고
    • Kapton - polyimide film. Available from: www.dupont.com/kapton/general/sumofprop.html (January 2005).
  • 15
    • 33746844815 scopus 로고    scopus 로고
    • Von Blanckenhagen B. Ph.D. thesis, Department of Physical Metallurgy, University of Stuttgart; 2002.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.