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Volumn 54, Issue 15, 2006, Pages 3863-3870
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Erratum to "Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction" [Acta Mater 54 (2006) 3863-3870] (DOI:10.1016/j.actamat.2006.03.057);Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction
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Author keywords
Copper; EBSD; Texture; Thin films; XRD
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Indexed keywords
COPPER;
ELECTRON DIFFRACTION;
GRAIN SIZE AND SHAPE;
TEXTURES;
X RAY DIFFRACTION ANALYSIS;
YIELD STRESS;
EBSD;
GRAIN SIZE STATISTICS;
POLYIMIDE SUBSTRATES;
THIN FILMS;
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EID: 33746861948
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2006.10.001 Document Type: Erratum |
Times cited : (74)
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References (21)
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