Characterization and testing of LAS: A prototype 'large area sensor' with performance characteristics suitable for medical imaging applications

IEEE Transactions on Nuclear Science

Volumn 56, Issue 5, 2009, Pages 2938-2946

  Bohndiek, S E ^a   Blue, A ^b   Cabello, J ^c   Clark, A T ^d   Guerrini, N ^d   Evans, P M ^e   Harris, E J ^e   Konstantinidis, A ^a   Maneuski, D ^b   Osmond, J ^e   O'Shea, V ^b   Speller, R D ^a   Turchetta, R ^d   Wells, K ^c   Zin, H ^e   Allinson, N M ^f  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c UNIVERSITY OF SURREY   (United Kingdom)

^d RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^e INSTITUTE OF CANCER RESEARCH   (United Kingdom)

^f UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

CMOS; Image sensors; Semiconductor devices

Indexed keywords

ACTIVE PIXEL; BREAST BIOPSIES; CHARACTERIZATION AND TESTING; CMOS; CMOS PROCESSS; CONVERSION GAIN; DIGITAL NUMBERS; FIXED PATTERN NOISE; FULL WELL CAPACITY; LARGE AREA SENSORS; NOISE PERFORMANCE; OUTPUT RANGE; PERFORMANCE CHARACTERISTICS; PROTOTYPE SENSOR; READ NOISE; SCATTERED RADIATIONS; TEST OBJECT; X RAY BEAM; X-RAY DIFFRACTION SYSTEM;

DIGITAL IMAGE STORAGE; IMAGE SENSORS; LITHIUM ALLOYS; MEDICAL IMAGING; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR SWITCHES; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

PIXELS;

EID: 70350150323     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2029575     Document Type: Article

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