메뉴 건너뛰기




Volumn 95, Issue 14, 2009, Pages

Lattice model for strained nanoscale ferroelectric capacitors: Investigation on fundamental size limits in ferroelectricity

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRAIN; CRITICAL THICKNESS; DEPOLARIZATION FIELDS; DIPOLE DIPOLE INTERACTIONS; EPITAXIAL STRESS; EXPERIMENTAL DATA; FERROELECTRIC CAPACITORS; FIRST PRINCIPLE CALCULATIONS; LATERAL DIMENSION; LATTICE MODELS; LATTICE STRUCTURES; MEAN-FIELD; METAL ELECTRODES; NANO SCALE; PT ELECTRODE; SIZE EFFECTS; SPONTANEOUS POLARIZATIONS; TYPE THEORY; UNIT CELLS;

EID: 70349934316     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3243338     Document Type: Article
Times cited : (16)

References (24)
  • 1
    • 0037417284 scopus 로고    scopus 로고
    • Critical thickness for ferroelectricity in perovskite ultrathin films
    • DOI 10.1038/nature01501
    • J. Junquera and P. Ghosez, Nature (London) 0028-0836 422, 506 (2003). 10.1038/nature01501 (Pubitemid 36433642)
    • (2003) Nature , vol.422 , Issue.6931 , pp. 506-509
    • Junquera, J.1    Ghosez, P.2
  • 3
    • 2942683586 scopus 로고    scopus 로고
    • Fundamental size limits in ferroelectricity
    • DOI 10.1126/science.1099822
    • N. A. Spaldin, Science 0036-8075 304, 1606 (2004). 10.1126/science. 1099822 (Pubitemid 38765837)
    • (2004) Science , vol.304 , Issue.5677 , pp. 1606-1607
    • Spaldin, N.A.1
  • 4
    • 34547299562 scopus 로고    scopus 로고
    • Elastic stabilization of a single-domain ferroelectric state in nanoscale capacitors and tunnel junctions
    • DOI 10.1103/PhysRevLett.98.257603
    • N. A. Pertsev and H. Kohlstedt, Phys. Rev. Lett. 0031-9007 98, 257603 (2007). 10.1103/PhysRevLett.98.257603 (Pubitemid 47139891)
    • (2007) Physical Review Letters , vol.98 , Issue.25 , pp. 257603
    • Pertsev, N.A.1    Kohlstedt, H.2
  • 10
    • 33845917737 scopus 로고    scopus 로고
    • Depolarizing field and "real" hysteresis loops in nanometer-scale ferroelectric films
    • DOI 10.1063/1.2408650
    • A. M. Bratkovsky and A. P. Levanyuk, Appl. Phys. Lett. 0003-6951 89, 253108 (2006). 10.1063/1.2408650 (Pubitemid 46035183)
    • (2006) Applied Physics Letters , vol.89 , Issue.25 , pp. 253108
    • Bratkovsky, A.M.1    Levanyuk, A.P.2
  • 13
    • 33746013199 scopus 로고    scopus 로고
    • Tunneling across a ferroelectric
    • DOI 10.1126/science.1126230
    • E. Y. Tsymbal and H. Kohlstedt, Science 0036-8075 313, 181 (2006). 10.1126/science.1126230 (Pubitemid 44066239)
    • (2006) Science , vol.313 , Issue.5784 , pp. 181-183
    • Tsymbal, E.Y.1    Kohlstedt, H.2
  • 15
    • 0037076989 scopus 로고    scopus 로고
    • Orienting ferroelectric films
    • DOI 10.1126/science.1072855
    • R. Ramesh and D. G. Schlom, Science 0036-8075 296, 1975 (2002). 10.1126/science.1072855 (Pubitemid 34627508)
    • (2002) Science , vol.296 , Issue.5575 , pp. 1975-1976
    • Ramesh, R.1    Schlom, D.G.2
  • 20
    • 0000062057 scopus 로고    scopus 로고
    • Thickness dependence of the effective dielectric constant in a thin film capacitor
    • DOI 10.1063/1.121930, PII S0003695198010316
    • K. Natori, D. Otani, and N. Sano, Appl. Phys. Lett. 0003-6951 73, 632 (1998). 10.1063/1.121930 (Pubitemid 128673866)
    • (1998) Applied Physics Letters , vol.73 , Issue.5 , pp. 632-634
    • Natori, K.1    Otani, D.2    Sano, N.3
  • 22
  • 23
    • 33645232550 scopus 로고    scopus 로고
    • 0021-8979,. 10.1063/1.2178391
    • N. Srivastava and G. J. Weng, J. Appl. Phys. 0021-8979 99, 054103 (2006). 10.1063/1.2178391
    • (2006) J. Appl. Phys. , vol.99 , pp. 054103
    • Srivastava, N.1    Weng, G.J.2
  • 24
    • 70349901949 scopus 로고    scopus 로고
    • note
    • 1 =4.124 (T-115) × 105, α11 =-2.097× 108, α111 =1.294× 109, α1111 =3.863× 1010, Q11 =0.1, Q12 =-0.034, S11 =8.05× 10-12, and S12 =-2.35× 10-12. This set corresponds to the thermodynamics parameters and the electrostrictive coefficients of BTO (Ref.) and the elastic compliances (Ref.).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.