Evolving variability-tolerant CMOS designs

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 5216 LNCS, Issue , 2008, Pages 308-319

  Walker, James Alfred ^a   Hilder, James A ^a   Tyrrell, Andy M ^a  

^a UNIVERSITY OF YORK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; GENETIC ALGORITHMS; GENETIC PROGRAMMING;

ATOMIC LEVELS; CARTESIAN GENETIC PROGRAMMING; CMOS DESIGN; CMOS DEVICES; FAILURE RATE; INTRINSIC DEVICE; SIMPLE GENETIC ALGORITHM; VARIABILITY TOLERANT;

CMOS INTEGRATED CIRCUITS;

EID: 70349849800     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-85857-7_27     Document Type: Conference Paper

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