Sacrificial removal of caps of aligned carbon nanotubes for interconnect application

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2009, Pages 1811-1815

  Xiao, Zhiyong ^a   Chai, Yang ^a   Chan, Philip C H ^a   Chen, Baoqin ^b   Zhao, Min ^b   Liu, Ming ^b  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNED CARBON NANOTUBES; AS-GROWN; CURRENT MEASUREMENTS; ELECTRICAL CONDUCTANCE; GRAPHENE SHEETS; INNER SHELL; INTERCONNECT APPLICATIONS; MECHANICAL AND THERMAL PROPERTIES; METAL ELECTRODES; MULTI-WALLED; PROMISING MATERIALS; SINGLE-WALLED; TERMINAL VOLTAGES;

CARBON NANOTUBES; ELECTRIC CURRENT MEASUREMENT; ELECTRIC PROPERTIES; GRAPHITE; MECHANICAL PROPERTIES; METAL RECOVERY; MULTIWALLED CARBON NANOTUBES (MWCN); THERMODYNAMIC PROPERTIES;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 70349695819     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2009.5074264     Document Type: Conference Paper

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