Superresolution in total internal reflection tomography

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 22, Issue 9, 2005, Pages 1889-1897

  Belkebir, Kamal ^a   Chaumet, Patrick C ^a   Sentenac, Anne ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; IMAGE QUALITY; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT SCATTERING; MATHEMATICAL MODELS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PERMITTIVITY; SENSITIVITY ANALYSIS;

ANGLE OF ILLUMINATION; BORN APPROXIMATION; INCIDENT POLARIZATION; TOTAL INTERNAL REFLECTION TOMOGRAPHY (TIRT);

TOMOGRAPHY;

EID: 25444462801     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.22.001889     Document Type: Article

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