SCOPUS 정보 검색 플랫폼

Volumn 80, Issue 9, 2009, Pages

Photoreflectance and contactless electroreflectance measurements of semiconductor structures by using bright and dark configurations

(2) Kudrawiec, R a Misiewicz, J a

a WROCLAW UNIVERSITY OF TECHNOLOGY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACTLESS ELECTROREFLECTANCE; EXPERIMENTAL SETUP; HALOGEN LAMPS; INNOVATIVE SOLUTIONS; MEASUREMENT CONDITIONS; MONOCHROMATIC LIGHT; OPTICAL PATH; PHOTOREFLECTANCE; QUANTUM DOT; QUANTUM WELL; ROOM TEMPERATURE; SEMICONDUCTOR STRUCTURE; SPECTRAL FEATURE; WHITE LIGHT;

EPITAXIAL LAYERS; OPTICAL TRANSITIONS; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WELLS;

MONOCHROMATORS;

EID: 70349673511 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3213613 Document Type: Article

Times cited : (62)

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7
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8
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9
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- Motyka, M.¹ Kudrawiec, R.² Misiewicz, J.³

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